Integrated wafer-scale growth and transfer of directional carbon nanotubes and misaligned-carbon-nanotube-immune logic structures

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2008, Pages 205-206

  Patil, Nishant ^a   Lin, Albert ^a   Myers, Edward R ^a   Philip Wong, H S ^a   Mitra, Subhasish ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE FIELD-EFFECT TRANSISTOR; CARBON NANOTUBES (CNTS); CRYSTAL QUARTZ; DIGITAL LOGIC; ESSENTIAL COMPONENTS; LOGIC FUNCTIONALITY; LOGIC STRUCTURES; NANO TUBE; QUARTZ WAFERS; VLSI TECHNOLOGIES; WAFER-SCALE;

ADMINISTRATIVE DATA PROCESSING; CARBON; DEMONSTRATIONS; FIELD EFFECT TRANSISTORS; NANOCOMPOSITES; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; NONMETALS; OXIDE MINERALS; QUARTZ; SCALE (DEPOSITS); SILICON; SILICON WAFERS; TECHNOLOGY;

CARBON NANOTUBES;

EID: 51949096624     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2008.4588619     Document Type: Conference Paper

References (4)

1. J. Deng, et al., Proc. ISSCC, 70-71 (2007).
2. Z. Chen, et al., Science, Vol. 311, 1735 (2006).
3. A. Reina, et al., J. Phys. Chem. C 111, 7292-7297 (2007).
4. S. Han, et al., J. of Am. Chem. Soc. 127, 5294-5295 (2005).