Predicting biometric facial recognition failure with similarity surfaces and support vector machines

2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops

Volumn , Issue , 2008, Pages

  Scheirer, W J ^a,b   Bendale, A ^a   Boult, T E ^a,b  

^a University of Colorado Colorado Springs   (United States)

^b Securics Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIOMETRIC SYSTEMS; DISTANCE MEASURES; FACIAL RECOGNITION; FACIAL RECOGNITION ALGORITHMS; FAILURE CONDITIONS; FAILURE PREDICTION; RAW IMAGES; ROBUST PCA; ROC CURVES; SIMILARITY SCORES;

ARTIFICIAL INTELLIGENCE; BIOMETRICS; COMPUTER SYSTEMS; COMPUTER VISION; FEATURE EXTRACTION; FORECASTING; IMAGE PROCESSING; IMAGE QUALITY; PATTERN RECOGNITION; PRINCIPAL COMPONENT ANALYSIS; SET THEORY; SUPPORT VECTOR MACHINES; SURFACE ANALYSIS; SYSTEMS ENGINEERING;

QUALITY CONTROL;

EID: 51849153839     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPRW.2008.4563124     Document Type: Conference Paper

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