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Volumn , Issue , 2008, Pages
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High-quality scanning using time-of-flight depth superresolution
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Author keywords
[No Author keywords available]
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Indexed keywords
3D DATA;
3D SCANNING;
CAMERA MODELING;
COLOR IMAGING;
DEPTH IMAGING;
DEPTH MEASUREMENTS;
HIGH RESOLUTIONS;
HIGH-QUALITY;
LOW-RESOLUTION;
REAL-WORLD;
SUPER RESOLUTIONS;
TIME-OF-FLIGHT;
UPSAMPLING METHODS;
VIDEO FRAMES;
ARTIFICIAL INTELLIGENCE;
CAMERAS;
COMMUNICATION CHANNELS (INFORMATION THEORY);
COMPUTER VISION;
FEATURE EXTRACTION;
IMAGE PROCESSING;
LAWS AND LEGISLATION;
NEGATIVE IONS;
PATTERN RECOGNITION;
RANDOM ERRORS;
SCANNING;
SIGNAL RECEIVERS;
SYSTEMATIC ERRORS;
THREE DIMENSIONAL;
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EID: 51849124684
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/CVPRW.2008.4563171 Document Type: Conference Paper |
Times cited : (135)
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References (16)
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