Full orientation invarlance and improved feature selectivity of 3D SIFT with application to medical image analysis

2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops

Volumn , Issue , 2008, Pages

  Allaire, Stephane ^a,b   Kim, John J ^a,b   Breen, Stephen L ^a,b   Jaffray, David A ^a,b   Pekar, Vladimir ^c  

^a PRINCESS MARGARET HOSPITAL   (Canada)

^b UNIVERSITY OF TORONTO   (Canada)

^c PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ARTIFICIAL INTELLIGENCE; COMPUTER VISION; DATA PROCESSING; FEATURE EXTRACTION; IMAGE ANALYSIS; IMAGE PROCESSING; IMAGING TECHNIQUES; PATTERN RECOGNITION;

3D ORIENTATION; AUTOMATED REGISTRATION; COMPUTATIONAL EFFORTS; DATA-SETS; DESCRIPTORS; FEATURE MATCHING; FEATURE SELECTIVITY; LARGE DATA VOLUMES; LOW CONTRAST; MEDICAL IMAGE ANALYSIS; MULTISCALE PROCESSING; SCALE-INVARIANT FEATURE TRANSFORM; VOLUMETRIC IMAGING;

THREE DIMENSIONAL;

EID: 51849124561     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CVPRW.2008.4563023     Document Type: Conference Paper

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