Current-voltage characteristics for lead zirconate titanate bulk ceramics

Journal of Applied Physics

Volumn 104, Issue 5, 2008, Pages

  Balke, Nina ^a,b   Granzow, Torsten ^a   Rödel, Jürgen ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BULK CERAMICS; CHARGE TRANSPORTING; ELECTRICAL CONDUCTION; ELECTRODE MATERIALS; FIELD CYCLING; HIGH FIELDS; LEAD ZIRCONATE TITANATE; LOW FIELDS; OHMIC CONDUCTION; POLARIZATION CURRENTS; POLARIZATION EFFECTS; ROBUST MEASUREMENT; SETTLING TIMES; SPACE CHARGE LIMITED CURRENTS;

BUILDING MATERIALS; CERAMIC MATERIALS; ELECTRIC FIELDS; ELECTROMAGNETIC FIELD THEORY; ELECTROMAGNETIC FIELDS; HEAT CONDUCTION; POLARIZATION; SEMICONDUCTING LEAD COMPOUNDS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 51849112773     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2976304     Document Type: Article

References (21)

1. T. P. Comyn, S. P. McBride, and A. J. Bell, Mater. Lett. 0167-577X 10.1016/j.matlet.2004.07.021 58, 3844 (2004).
2. T. Mihara, H. Watanabe, and C. A. Paz de Araujo, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.33.3996 33, 3996 (1994).
3. C. Verdier, J. Eur. Ceram. Soc. 0955-2219 10.1016/S0955-2219(02)00351-5 23, 1409 (2003).
4. N. Balke, D. C. Lupascu, T. Granzow, and J. Rödel, J. Am. Ceram. Soc. 0002-7820 10.1111/j.1551-2916.2007.01520.x 90, 1081 (2007).
5. A. Rose, Phys. Rev. 10.1103/PhysRev.97.1538 97, 1538 (1955). 0031-899X
6. V. M. Fridkin and K. Kreher, Phys. Status Solidi A 2, 281 (1970).
7. T. Mihara and H. Watanabe, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.34.5664 34, 5664 (1995).
8. R. H. Walden, J. Appl. Phys. 0021-8979 10.1063/1.1661233 43, 1178 (1972).
9. T. P.-C. Juan, S. -M. Chen, and J. Y.-M. Lee, J. Appl. Phys. 0021-8979 10.1063/1.1646441 95, 3120 (2004).
10. Y. S. Yang, S. J. Lee, S. H. Kim, G. Chae, and M. S. Jang, J. Appl. Phys. 0021-8979 10.1063/1.368747 84, 5005 (1998).
11. A. R. Chaudhuri and S. B. Krupanidhi, J. Appl. Phys. 0021-8979 10.1063/1.2128476 98, 094112 (2005).
12. S. Bhattacharyya, A. Laha, and S. B. Krupanidhi, J. Appl. Phys. 0021-8979 10.1063/1.1448396 91, 4543 (2002).
13. T. Mihara, H. Watanabe, and C. A. Paz de Araujo, Jpn. J. Appl. Phys., Part 1 0021-4922 10.1143/JJAP.33.5281 33, 5281 (1994).
14. W. Y. Hsu, J. D. Luttmer, R. Tsu, S. Summerfelt, M. Bedekar, T. Tokumoto, and J. Nulman, Appl. Phys. Lett. 0003-6951 10.1063/1.114248 66, 2975 (1995).
15. C. Sudhama, A. C. Campbell, P. D. Maniar, R. E. Jones, R. Moazzami, C. J. Mogab, and J. C. Lee, J. Appl. Phys. 0021-8979 10.1063/1.356508 75, 1014 (1994).
16. T. K. Kundu and J. Y.-M. Lee, J. Electrochem. Soc. 0013-4651 10.1149/1.1393194 147, 326 (2000).
17. Sze, Physics of Semiconductor Devices (Wiley, New York, 1981).
18. D. C. Lupascu, S. Fedosov, C. Verdier, J. Rödel, and H. von Seggern, J. Appl. Phys. 0021-8979 10.1063/1.1636528 95, 1386 (2004).
19. R. H. Tredgold, Space Charge Conduction in Solids (Elsevier, Amsterdam, 1966).
20. J. F. Scott, C. A. Araujo, B. M. Melnick, L. D. McMillan, and R. Zuleeg, J. Appl. Phys. 0021-8979 10.1063/1.350286 70, 382 (1991).
21. N. Balke, H. Kungl, T. Granzow, D. C. Lupascu, M. J. Hoffmann, and J. Rödel, J. Am. Ceram. Soc. 90, 3869 (2007). 0002-7820