300GHz Transistor Performance in Production CMOS Technologies

Device Research Conference - Conference Digest, DRC

Volumn , Issue , 2006, Pages 199-200

  Jagannafhan, Basanth ^a   Chidambarrao, Dureseti ^a   Pekarik, John ^a  

^a IBM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT DESIGN; LOW POWER ELECTRONICS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; POWER MOSFET; PRINTED CIRCUIT DESIGN; SYSTEM-ON-CHIP;

CMOS NODES; CMOS TECHNOLOGY; CONTINUOUS IMPROVEMENTS; LOW POWER; MM-WAVE APPLICATION; RF PERFORMANCE; SHORT CHANNEL MOSFETS; SILICON MOSFET; TECHNOLOGY SCALING; TRANSISTOR PERFORMANCE;

CMOS INTEGRATED CIRCUITS;

EID: 51849111905     PISSN: 15483770     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. S. J.Lee et al, IEDM 2005.
2. N. Yasutake et al, VLSI, 2004, p.84.
3. W.-H. Lee et al, IEDM 2005.
4. M. Hortsmann et al, IEDM 2005.
5. E. Leobandung et al, VLSI 2004, p. 126.