A novel method for HBT intrinsic collector resistance extraction from S-parameters

Asia-Pacific Microwave Conference Proceedings, APMC

Volumn , Issue , 2007, Pages

  Johansen, Tom ^a   Krozer, Viktor ^a   Hadziabdic, Dzenan ^a   Jiang, Chenhui ^a   Konczykowska, Agnieszka ^b   Dupuy, Jean Yves ^b  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b ALCATEL THALES III V LAB   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; MICROWAVES; SCATTERING PARAMETERS;

ACTIVE REGIONS; ASIA-PACIFIC; COLLECTOR RESISTANCE; ERROR TERMS; EXTRACTION METHODS; HIGH SPEEDS; INP-DHBT; MODEL RESPONSES; NOVEL METHODS; S-PARAMETERS; SERIES RESISTANCES; SIGNAL MODELING;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 51849108959     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APMC.2007.4555014     Document Type: Conference Paper

References (7)

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