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Volumn , Issue , 2008, Pages

Fast analytical parameters fitting of planar spiral inductors

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNA ACCESSORIES; ANTENNAS; ELECTRIC INDUCTORS; ELECTRONICS ENGINEERING; FIGHTER AIRCRAFT; FREQUENCY ESTIMATION; LEAST SQUARES APPROXIMATIONS; MICROWAVE ANTENNAS; MICROWAVES; SCATTERING PARAMETERS; STANDARDS; TECHNOLOGY;

EID: 51849105658     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/COMCAS.2008.4562827     Document Type: Conference Paper
Times cited : (1)

References (7)
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    • Kang, M.1
  • 2
    • 0037348311 scopus 로고    scopus 로고
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    • Mar
    • Y. Cao et al., "Frequency-Independent Equivalent-Circuit Model for OnChip Spiral Inductors," in IEEE JSSCC, Mar. 2003, pp. 419-426.
    • (2003) IEEE JSSCC , pp. 419-426
    • Cao, Y.1
  • 3
    • 0033875648 scopus 로고    scopus 로고
    • Physical modeling of spiral inductors on silicon
    • Mar
    • C. Yue et al., "Physical modeling of spiral inductors on silicon," in IEEE Tran, on Electron Devices, vol. 47, Mar. 2000, pp. 560-568.
    • (2000) IEEE Tran, on Electron Devices , vol.47 , pp. 560-568
    • Yue, C.1
  • 4
    • 51849083364 scopus 로고    scopus 로고
    • Microwave Engineering
    • 2nd ed, p
    • D. Pozar, "Microwave Engineering", Wiley&Sons, 2nd ed, p. 212, 1998.
    • (1998) Wiley&Sons , pp. 212
    • Pozar, D.1
  • 5
    • 0034790426 scopus 로고    scopus 로고
    • A 0.13 μm CMOS Platform with Cu/low-k Interconnect for System on Chip Application
    • T. Schiml et al., "A 0.13 μm CMOS Platform with Cu/low-k Interconnect for System on Chip Application," in Symp. VLSI Technology Dig. Tech. Papers, 2001, pp. 101-102.
    • (2001) Symp. VLSI Technology Dig. Tech. Papers , pp. 101-102
    • Schiml, T.1
  • 6
    • 27644492287 scopus 로고    scopus 로고
    • Novel realistic short structure construction for parasitic resistance de-embedding and on-wafer inductor characterization,
    • J. Tao et al., "Novel realistic short structure construction for parasitic resistance de-embedding and on-wafer inductor characterization, " in IEEE Conf. on Microelectronic Test Structures, vol. 18, pp. 187-190.
    • IEEE Conf. on Microelectronic Test Structures , vol.18 , pp. 187-190
    • Tao, J.1
  • 7
    • 50049126131 scopus 로고    scopus 로고
    • High Frequency Characterization of Thin-Film Redistribution Layers for Embedded Wafer Level BGA
    • M. Wojnowski et al., "High Frequency Characterization of Thin-Film Redistribution Layers for Embedded Wafer Level BGA," in IEEE Electronics Packaging Technology Conference, 2007, pp. 308-314.
    • (2007) IEEE Electronics Packaging Technology Conference , pp. 308-314
    • Wojnowski, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.