Optimal resolution of LBIV/LBIC methods for diagnostics of solar cell homogeneity

"2008 26th International Conference on Microelectronics, Proceedings, MIEL 2008"

Volumn , Issue , 2008, Pages 251-253

  Salinger, Jan ^a   Benda, Vitezslav ^a   Machacek, Zdenek ^a  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FAULT LOCATION; ELECTROMAGNETIC WAVES; INDUCED CURRENTS; SOLAR ENERGY;

INDUCED VOLTAGES; INTERNATIONAL CONFERENCES; LIGHT-BEAM-INDUCED-CURRENT;

SHORT CIRCUIT CURRENTS;

EID: 51749101289     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMEL.2008.4559271     Document Type: Conference Paper

References (5)

1. Goetzberger A., Knobloch J. and Voss B.: Crystalline Silicon Solar Cells, J.Wiley & Sons, 1998
2. th European Photovoltaic Conference on Solar Energy Conversion, Glasgow 2000, VA1.39
3. th European Photovoltaic Solar Energy Conference, Barcelona 2005, 670-673.
4. Benda V., Macháček Z., A Note on Diagnostics of Homogeneity of Recombination Rate in Large-Area Silicon Solar Cells Using Local Irradiation, Pro. 21st European Photovoltaic Solar Energy Conference, 2006, 1508-1511.
5. + Layer Homogeneity in Large Area Silicon Solar Cells Using Local Irradiation. Proc. 21st European Photovoltaic Solar Energy Conference, 2006, 1512-15.