-
1
-
-
51749098705
-
-
J. Zhou, W. Dehaene, Comparison of logic families for improved EMC behavior of mixed-signal ICs, 5th International Workshop on Electromagnetic Compatibility of Integrated Circuits, Munich, Germany, Nov.28-30, 2005.
-
J. Zhou, W. Dehaene, "Comparison of logic families for improved EMC behavior of mixed-signal ICs," 5th International Workshop on Electromagnetic Compatibility of Integrated Circuits, Munich, Germany, Nov.28-30, 2005.
-
-
-
-
2
-
-
44849088911
-
-
J. Zhou, W. Dehaene, A Fully integrated Low EMI noise Power Supply Technique for CMOS Digital IC's in Automotive Application, Proceedings of the 33rd European Solid-State Circuits Conference (ESSCIRC), Munich, Germany, Sept.11-13, pp.264-267, 2007.
-
J. Zhou, W. Dehaene, "A Fully integrated Low EMI noise Power Supply Technique for CMOS Digital IC's in Automotive Application," Proceedings of the 33rd European Solid-State Circuits Conference (ESSCIRC), Munich, Germany, Sept.11-13, pp.264-267, 2007.
-
-
-
-
3
-
-
0033338654
-
A New Low-Noise Family for Mixed-Signal Integrated Circuits
-
Dec
-
E. Albuquerque, M. Silva, "A New Low-Noise Family for Mixed-Signal Integrated Circuits," IEEE Trans. on Circuits and Systems-I, vol. 46, no. 12, Dec. 1999, pp. 1498-1500.
-
(1999)
IEEE Trans. on Circuits and Systems-I
, vol.46
, Issue.12
, pp. 1498-1500
-
-
Albuquerque, E.1
Silva, M.2
-
4
-
-
0036045876
-
-
Z. Butkovic, A. Szabo,Current-balanced logic in submicron technology, IEEE MELECON 2002, May.7-9, 2002, pp.41-44, Cairo, EGYPT.
-
Z. Butkovic, A. Szabo,"Current-balanced logic in submicron technology," IEEE MELECON 2002, May.7-9, 2002, pp.41-44, Cairo, EGYPT.
-
-
-
-
5
-
-
0032715366
-
Current-Balanced Logic for Mixed-Signal ICs
-
E. Albuquerque, M. Silva, "Current-Balanced Logic for Mixed-Signal ICs," Proc. IEEE Int. Synp. Circuits Syst., vol.1, 1999, pp. 274-277.
-
(1999)
Proc. IEEE Int. Synp. Circuits Syst
, vol.1
, pp. 274-277
-
-
Albuquerque, E.1
Silva, M.2
-
6
-
-
0003850954
-
-
2nd Edition, Prentice Hall
-
Jan M. Rabaey, Anantha Chandrakasan, Borivoje Nikolic, "Digital Integrated Circuit - A Design Perspective", 2nd Edition, Prentice Hall, 2003.
-
(2003)
Digital Integrated Circuit - A Design Perspective
-
-
Rabaey, J.M.1
Chandrakasan, A.2
Nikolic, B.3
-
7
-
-
51749115908
-
-
W. Dehaene, Semiconductor process variability: consequences and solutions, in ProRisc, 2006
-
W. Dehaene, "Semiconductor process variability: consequences and solutions", in ProRisc, 2006
-
-
-
-
8
-
-
0033697565
-
Test challenges for deep sub-micron technologies
-
Cheng. Kwang-Ting, S. Dey, M. Rodgers, K. Roy, "Test challenges for deep sub-micron technologies,"37th Design Automation Conference (DAC'03), 2000, pp. 142-149.
-
(2000)
37th Design Automation Conference (DAC'03)
, pp. 142-149
-
-
Cheng1
Kwang-Ting, S.2
Dey3
Rodgers, M.4
Roy, K.5
|