A Bayesian life test sampling plan for non-repairable products sold under warranty

International Journal of Quality and Reliability Management

Volumn 13, Issue 5, 1996, Pages 40-49

  Kwon, Y I ^a  

^a Chongju University   (South Korea)

Author keywords

Bayesian statistics; Sampling

Indexed keywords

EID: 51749090663     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656719610118133     Document Type: Article

References (17)

1. Epstein, B., Sobel, M. (1953), "Life testing" in Journal of the American Statistical Association, Vol. 48, pp. 485-502.
2. Epstein, B. (1954), "Truncated life tests in the exponential case" in Annals of Mathematical Statistics, Vol. 25, pp. 555-64.
3. Bulgren, W., Hewette, J. (1973), "Double sample test for hypotheses about the mean of an exponential distribution" in Technometrics, Vol. 15, pp. 187-90.
4. Fairbanks, K. (1988), "A two-stage life test for the exponential parameter" in Technometrics, Vol. 30, pp. 175-80.
5. Epstein, B., Sobel, M. (1955), "Sequential life test in the exponential case" in Annals of Mathematical Statistics, Vol. 26, pp. 82-93.
6. Aroian, L.A. (1964), "Some comments on truncated sequential tests for the exponential distribution" in Industrial Quality Control, Vol. 21, pp. 309-12.
7. (1960), "H 108", Sampling Procedures and Tables for Life and Reliability Testing Based on Exponential Distribution, Quality Control and Reliability Handbook, US Department of Defense, Washington.
8. (1977), "MIL-STD-781C", Reliability Design Qualification and Production Acceptance Tests: Exponential Distribution, US Department of Defense, Washington, DC.
9. (1987), "MIL-HDBK-781", Reliability Test Methods, Plans and Environments for Engineering Development, Qualification and Production, US Department of Defense, Washington, DC.
10. Soland, R.M. (1968), "Bayesian analysis of the Weibull process with unknown scale parameter and its application to acceptance sampling" in IEEE Transactions on Reliability, R-17, pp. 84-90.
11. Thyregod, P. (1975), "Bayesian single sampling plans for life testing with truncation of the number of failures" in Scandinavian Journal of Statistics, Vol. 2, pp. 61-70.
12. Nigm, A.M., Ismail, M.A. (1985), "Bayesian life test sampling plans for the two parameter exponential distribution" in Communications in Statistics - Simulation and Computation, Vol. 14, pp. 691-707.
13. Dunsmore, I.R., Wright, D.E. (1985), "A decisive predictive approach to the construction of sequential acceptance sampling plans for lifetimes" in Applied Statistics, Vol. 34, pp. 1-13.
14. Bai, D.S., Kwon, Y.I. (20), "Economic designs of life test sampling plans for repairable products", Engineering Optimization.
15. Heschel, M. (1971), "How much is a guarantee worth?" in Industrial Engineering, Vol. 3, pp. 14-15.
16. Nguyen, D.G., Murthy, D.N.P. (1984), "A general model for estimating warranty costs for repairable products" in IIE Transactions, Vol. 16, pp. 379-86.
17. Thomas, M.U. (1983), "Optimum warranty policies for the non-repairable items" in IEEE Transaction on Reliability, R-32, pp. 282-8.