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Volumn , Issue , 2008, Pages 8-11

Towards an EMC roadmap for Integrated Circuits

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; AUTOMOBILE ELECTRONIC EQUIPMENT; COMPUTER NETWORKS; CONSUMER ELECTRONICS; ELECTRIC INVERTERS; ELECTROMAGNETISM; INTEGRATED CIRCUITS; MAGNETIC MATERIALS; NETWORKS (CIRCUITS); PLASTIC MOLDS; PROGRAMMABLE LOGIC CONTROLLERS;

EID: 51749087741     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APEMC.2008.4559798     Document Type: Conference Paper
Times cited : (20)

References (10)
  • 6
    • 33751051278 scopus 로고    scopus 로고
    • A Linear Equivalent Circuit and a Current Source Model with I/O (LECCS-I/O) for Simulating Multi-bit Drives
    • Angers, April 04
    • H. Osaka, et al., A Linear Equivalent Circuit and a Current Source Model with I/O (LECCS-I/O) for Simulating Multi-bit Drives, 4th Int. Workshop on EMC of Integrated Circuits (EMC Compo 04), pp. 101-106, Angers, April 04
    • 4th Int. Workshop on EMC of Integrated Circuits (EMC Compo 04) , pp. 101-106
    • Osaka, H.1
  • 7
    • 51749089714 scopus 로고    scopus 로고
    • Mart Coenen, Dick de Greef, Optimization techniques for minimizing IR-drop and supply bounce, EMC Compo 05
    • Mart Coenen, Dick de Greef, Optimization techniques for minimizing IR-drop and supply bounce, EMC Compo 05
  • 8
    • 51749111573 scopus 로고    scopus 로고
    • + Design Automation Roadmap, July 2005, online at www.medeaplus.org
    • + Design Automation Roadmap, July 2005, online at www.medeaplus.org
  • 9
    • 51749114823 scopus 로고    scopus 로고
    • public.itrs.net
    • public.itrs.net
  • 10
    • 51749114598 scopus 로고    scopus 로고
    • E. Lamoureux A new tool for testing the susceptibility of integrated circuits to microwave aggressions, ICEMC 2005, Pucket
    • E. Lamoureux "A new tool for testing the susceptibility of integrated circuits to microwave aggressions", ICEMC 2005, Pucket


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.