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Applied Mathematical Modelling
Volumn 33, Issue 1, 2009, Pages 597-604
A new integrated DEA model for finding most BCC-efficient DMU
Author keywords

Facility layout design; Integrated DEA model; Most BCC efficient DMU
Indexed keywords

LINEARIZATION; PLANT LAYOUT;
EID: 51749087006     PISSN: 0307904X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apm.2008.02.001     Document Type: Article
Times cited : (76)
References (10)
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    • Integrating data envelopment analysis and analytic hierarchy for the facility layout design in manufacturing systems
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.