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Volumn 2, Issue 1, 1995, Pages 83-91

Light optical deformation measurements in microbars with nanometer resolution

Author keywords

[No Author keywords available]

Indexed keywords


EID: 51649135650     PISSN: 09467076     EISSN: 14321858     Source Type: Journal    
DOI: 10.1007/BF02739536     Document Type: Article
Times cited : (8)

References (19)
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    • Born M; Wolf E (1964) Principles of Optics. Pergamon Press 419–424
  • 4
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    • Ding X (1990) Mechanical properties of silicon films and capacitive microsensors. PhD Thesis Case Western Reserve University
  • 5
    • 84936120345 scopus 로고    scopus 로고
    • Foerstner W; Guelch E (1987) A fast Operator for Detection and Precise Location of Distinct Points, Corners and Centres of Circular Features. In Proc. of ICFPPD, 281–305
  • 6
    • 84936160979 scopus 로고    scopus 로고
    • Gruen A (1984) Adaptive Least Squares Correlation. Concept and first Results. Internal Report prepared for Helava Associates, Inc., Columbus, Ohio, March 1984
  • 8
    • 84936126477 scopus 로고    scopus 로고
    • Gruen A; Stallmann D (1991) High accuracy edge matching with an extension of the MPGC-matching algorithm. SPIE Proceedings, 1526, Industrial Vision Metrology, Winnipeg, 42–55
  • 9
    • 84936109985 scopus 로고    scopus 로고
    • Hough PVC (1962) A method and means for recognizing complex patterns. U.S. Patent 3,069,654
  • 14
    • 84936156355 scopus 로고    scopus 로고
    • Najafi K; Suzuki K (1989) A novel technique and structure for the measurement of intrinsic stress and Young's modulus of thin film. Proc. IEEE Micro Electro Mechanical Systems, Salt Lake City, Utah, Febr. 20–22, 96–97
  • 18
    • 84936103144 scopus 로고    scopus 로고
    • Tai YC; Muller RS (1988) Fracture strain of LPCVD polysilicon. Technical Digest IEEE solid state sensor and actuators, South Carolina


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.