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Volumn , Issue , 2008, Pages 641-642
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Reliability assessment of high temperature electronics and packaging technologies for venus mission
a a a a b a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 51549116492
PISSN: 15417026
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/RELPHY.2008.4558966 Document Type: Conference Paper |
Times cited : (10)
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References (2)
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