Characterizing chip-multiprocessor variability-tolerance

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 313-318

  Herbert, Sebastian ^a   Marculescu, Diana ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Chip multiprocessor; Frequency islands; Process variability

Indexed keywords

CHIP-MULTIPROCESSOR; DESIGN AUTOMATION CONFERENCE; FREQUENCY ISLANDS; PROCESS VARIABILITY; PROCESS VARIATIONS;

ADAPTIVE SYSTEMS; COMPUTER AIDED DESIGN; DIES; DIGITAL INTEGRATED CIRCUITS; INDUSTRIAL ENGINEERING; LANDFORMS; NANOTECHNOLOGY; THROUGHPUT;

DESIGN;

EID: 51549103335     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555830     Document Type: Conference Paper

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