Wettability of interface boundaries as an indicator of their properties and state

Protection of Metals

Volumn 44, Issue 5, 2008, Pages 419-429

  Emelyanenko, A M ^a  

^a FRUMKIN INSTITUTE OF PHYSICAL CHEMISTRY AND ELECTROCHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC COMPOUNDS; CHEMICAL EQUIPMENT; CHEMICAL PROPERTIES; CHEMISTRY; COMPUTER NETWORKS; CONTACT ANGLE; DATA PROCESSING; DROPS; FLUID MECHANICS; MATERIALS PROPERTIES; PHYSICAL CHEMISTRY; SURFACE PHENOMENA;

CONTACT ANGLES; SESSILE DROPS;

SURFACE CHEMISTRY;

EID: 51549103004     PISSN: 00331732     EISSN: None     Source Type: Journal    
DOI: 10.1134/S0033173208050019     Document Type: Article

References (61)

1. Beysens, D. and Knobler, C.M., Phys. Rev. Lett., 1986, vol. 57, p. 1433.
2. Fritter, D., Knobler, C.M., Roux, D., and Beysens, D., J. Stat. Phys., 1988, vol. 52, p. 1447.
3. Frank, B. and Garoff, S., Langmuir, 1995, vol. 11, no. 11, p. 4333.
4. Adamson, A.W., Physical Chemistry of Surfaces, New York: Wiley, 1982.
5. Padday, J.F., In Surfaces and Colloid Science, Matijevic, E., Ed., New York: Wiley, 1968, vol. 1, p. 101.
6. Zorin, Z., Platikanov, D., and Kolarov, T., Coll. Surf., 1987, vol. 22, no. 1, p. 147.
7. Zorin, Z.M., Kolloid. Zh., 1977, vol. 39, no. 6, p. 1158.
8. Kolarov, T., Zorin, Z., and Platikanov, D., Coll. Surf., 1990, vol. 51, no. 1, p. 37.
9. Chen, J.D. and Wada, N., J. Coll. Interf. Sci., 1992, vol. 148, no. 1, p. 207.
10. Shen, C. and Ruth, D.W., J. Coll. Interf. Sci., 1994, vol. 168, no. 1, p. 162.
11. Neumann, A.W. and Good. R.J., In Surface and Colloid Science, Good, R.J. and Stromberg, R.S., Eds., New York: Plenum, 1979, vol. 11, p. 31.
12. Neumann, A.W., Adv. Coll. Interf. Sci., 1974, vol. 4, no. 1, p. 105.
13. Redon, C., Ausserre, D., and Rondelez, F., Macromolecules, 1992, vol. 25, no. 22, p. 5965.
14. Song, B. and Springer, J., Molec. Crystals Liq. Crystals, 1997, vol. 293, no. 1, p. 39.
15. Li, D. and Neumann, A.W., Coll. Surf. A, 1990, vol. 43, no. 1, p. 195.
16. Marsh, J.A., Garoff, S., and Dussan, E.B., Phys. Rev. Lett., 1993, vol. 70, no. 10, p. 2778.
17. Jennings, J.W., Jr. and Pallas, N.R., Langmuir, 1988, vol. 4, no. 4, p. 959.
18. Pallas, N.R. and Harrison, Y., Coll. Surf. A, 1990, vol. 43, no. 1, p. 169.
19. Hansen, F.K., J. Coll. Interf. Sci., 1993, vol. 160, no. 1, p. 209.
20. Gu, Y., Li, D., and Cheng, P., J. Coll. Interf. Sci., 1996, vol. 180, no. 1, p. 212.
21. Duncan, D., Li, D., Gaydos, J., and Neumann, A.W., J. Coll. Interf. Sci., 1995, vol. 169, no. 2, p. 256.
22. Li, D., Cheng, P., and Neumann, A.W., Adv. Coll. Interf. Sci., 1992, vol. 39, no. 2, p. 347.
23. Cheng, P., Li, D., Boruvka, L., Rotenberg, Y., and Neumann, A.W., Coll. Surf. A, 1990, vol. 43, no. 1, p. 151.
24. Gonzalez, R. and Woods, R., Digital Image Processing, New York: Addison-Wesley, 1993.
25. Russ, J.C., The Image Processing Handbook, Boca Raton: CRC, 2002.
26. Emelyanenko, A.M. and Boinovich, L.B., Kolloid. Zh., 2001, vol. 63, no. 2, p. 178. English Translation: Colloid J. 2001, vol 63. no. 2, p. 178.
27. Rusanov, A.I. and Prokhorov, V.A., Mezhfaznaya tenziometriya (Interface Tensiometry), St.-Petersburg: Khimiya, 1994.
28. Rotenberg, Y., Boruvka, L., and Neumann, A.W., J. Coll. Interf. Sci., 1983, vol. 93, no. 1, p. 169.
29. Emelyanenko, A.M., Issledovano v Rossii (Electronic Journal), 2004, no. 35, p. 373.
30. Emelyanenko, A.M. and Boinovich, L.B., Pribory Tekhnika Eksperimenta, 2002, no. 2, p. 167.
31. McHale, G., Kab, N.A., Newton, M.I., and Rowan, S.M., J. Coll. Interf. Sci., 1997, vol. 186, p. 453.
32. Kasuga, T., Hiramatsu, M., Hoson, A., Sekino, T., and Niihara, K., Langmuir, 1998, vol. 14, no. 12, p. 3160.
33. Emelyanenko, A.M., Ermolenko, N.V., and Boinovich, L.B., Coll. Surf. A, 2004, vol. 239, nos. 1-3, p. 25.
34. Anastasiadis, S.H., Chen, J.K., Koberstein, J.T., et al., J. Coll. Interf. Sci., 1987, vol. 119, no. 1, p. 55.
35. Song, B. and Springer, J., J. Coll. Interf. Sci., 1996, vol. 184, no. 1, p. 64.
36. Song, B. and Springer, J., J. Coll. Interf. Sci., 1996, vol. 184, no. 1, p. 77.
37. Cheng, P. and Newmann, A.W., Coll. Surf., 1992, vol. 62, no. 4, p. 297.
38. Emelyanenko, A.M. and Boinovich, L.B., Coll. Surf. A, 2001, vol. 189, p. 197.
39. Young, T., Phil. Trans. Roy. Soc. London, 1905, vol. 95, p. 65.
40. Cassie, A.B.D., Disc. Faraday Soc., 1948, vol. 3, p. 11.
41. Swain, P.S. and Lipowsky, R., Langmuir, 1998, vol. 14, p. 6772.
42. Cassie, A.B.D. and Baxter, S., Trans. Faraday Soc., 1944, vol. 40, p. 546.
43. Wenzel, R., Ind. Eng. Chem., 1936, vol. 28, p. 988.
44. Deryagin, B.V., Compt. Rend. Acad. Sci. URSS, 1946, vol. 51, p. 361.
45. Vu, C.H., Seo, D>W., Kim, H.J., and Kim, J.K., Key Eng. Mater, 2006, vols. 306-308, p. 423.
46. Thorpe, A.A., Peters, V., Smith, J.R., et al., J. Fluor. Chem., 2000, vol. 104, p. 37.
47. Dickson, J.L., Gupta, G., Horozov, T.S., et al., Langmuir, 2006, vol. 22, p. 2161.
48. McHale, G., Shirtcliffe, N.J., and Newton, M.I., Analyst, 2004, vol. 129, p. 284.
49. Sun, T., Feng, L., Gao, X., and Jiang, L., Acc. Chem. Res., 2005, vol. 38, p. 644.
50. Callies, M., and Quere, D., Soft Matter, 2005, vol. 1, p. 55.
51. Zhao, Y., Lu, Q., Chen, D., and Wei, Y., J. Mater. Chem., 2006, vol. 16, p. 4504.
52. Zhu, L. and Jin, Y., Appl. Surf. Sci., 2007, vol. 253, p. 3432.
53. Chibowski, E., Holysz, L., Terlipowski, K., and Jurak, M., Coll. Surf. A, 2006, vol. 291, p. 181.
54. Laibinis, P.E. and Whitesides, G.M., J. Am. Chem. Soc., 1992, vol. 114, p. 1990.
55. Kwok, D.Y., Gietzelt, T., Grundke, K., et al., Langmuir, 1997, vol. 13, no. 10, p. 2880.
56. Frenkel, Ya.I., Zh. Eksp. Teor. Fiz., 1948, vol. 18, no. 7, p. 659.
57. Martynov, G.A., Starov, V.M., and Churaev, N.V., Kolloid. Zh., 1977, vol. 39, no. 3, p. 472.
58. Athanassiou, A., Lygeraki, M.I., Pisignano, D., et al., Langmuir, 2006, vol. 22, p. 2329.
59. Athanassiou, A., Kalyva, M., Lakiotaki, K., et al., Adv. Mater., 2005, vol. 17, p. 988.
60. Wang, R., Kido, M., and Mukai, K., Key Eng. Mater., 2006, vols. 321-323, p. 1326.
61. Wang, R., Takeda, M., and Kido, M., Scripta Mater., 2002, vol. 46, p. 83.