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Volumn 26, Issue 3, 2008, Pages 555-561

Dielectric and structural characteristics of Sm doped Ba4la 9.33Ti18O54 ceramics

Author keywords

Ceramics; Electric permittivity; Loss tangent; Scanning electron microscopy; X ray diffraction

Indexed keywords

CERAMICS; ELECTRIC PERMITTIVITY; LOSS TANGENT; SCANNING ELECTRON MICROSCOPY; X-RAY DIFFRACTION;

EID: 51549101652     PISSN: 01371339     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (6)

References (15)
  • 10
    • 0037431189 scopus 로고    scopus 로고
    • LIN I-NAN, Mat. Chem. Phys
    • CHENG C.C., HSIEH T.E., LIN I-NAN, Mat. Chem. Phys., 79 (2003), 119.
    • (2003) , vol.79 , pp. 119
    • CHENG, C.C.1    HSIEH, T.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.