Threshold-voltage recovery of a-Si:H digital circuits

Journal of the Society for Information Display

Volumn 14, Issue 11, 2006, Pages 1053-1057

  Venugopal, Sameer M ^a   Allee, David R ^a   Li, Zi ^a   Clark, Lawrence T ^a  

^a Arizona State University   (United States)

Author keywords

Amorphous silicon; Circuit aging; Thin film transistor; Threshold voltage shift

Indexed keywords

AMORPHOUS SILICON; DIGITAL ARITHMETIC; DIGITAL INTEGRATED CIRCUITS; NETWORKS (CIRCUITS); SEMICONDUCTING ORGANIC COMPOUNDS; SILICON; THIN FILM DEVICES; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

APPLIED VOLTAGES; CIRCUIT AGING; OPERATIONAL LIFETIMES; THIN-FILM TRANSISTOR; THRESHOLD-VOLTAGE SHIFT; VOLTAGE RECOVERIES;

DIGITAL CIRCUITS;

EID: 51549100277     PISSN: 10710922     EISSN: None     Source Type: Journal    
DOI: 10.1889/1.2393030     Document Type: Article

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