An automated technique for image noise identification using a simple pattern classification approach

Midwest Symposium on Circuits and Systems

Volumn , Issue , 2007, Pages 819-822

  Chen, Yixin ^a   Das, Manohar ^b  

^a DELPHI CORPORATION   (United States)

^b Oakland University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FEATURE EXTRACTION; STATISTICAL METHODS;

IDENTIFICATION METHODS; IMAGE FILTERING; PATTERN CLASSIFICATIONS; STATISTICAL FEATURES;

CLASSIFICATION (OF INFORMATION);

EID: 51449122288     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2007.4488699     Document Type: Conference Paper

References (15)

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