Eliminating non-determinism during test of high-speed source synchronous differential buses

Proceedings of the IEEE VLSI Test Symposium

Volumn 2003-January, Issue , 2003, Pages 121-127

  Mohanram, K ^a   Touba, N A ^a  

^a The University of Texas at Austin   (United States)

Author keywords

Automatic testing; Bandwidth; Circuit testing; Clocks; Frequency; Hardware; Integrated circuit interconnections; Packet switching; Power system interconnection; Test equipment

Indexed keywords

AUTOMATIC TESTING; BANDWIDTH; CLOCKS; COMPUTER HARDWARE; DESIGN FOR TESTABILITY; EQUIPMENT TESTING; HARDWARE; INTEGRATED CIRCUIT INTERCONNECTS; PACKET SWITCHING; SPEED; VLSI CIRCUITS;

CIRCUIT TESTING; FREQUENCY; INTEGRATED CIRCUIT INTERCONNECTIONS; POWER SYSTEM INTERCONNECTION; TEST EQUIPMENTS;

INTEGRATED CIRCUIT TESTING;

EID: 51449114550     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTEST.2003.1197642     Document Type: Conference Paper

References (12)

1. Technical Specifications, Agilent 93000 SOC Series NP-models, Agilent Technologies, 2001.
2. Bouvier, D., "RapidIO™: An Embedded System Component Network Architecture," RapidIO™ Trade Association, 2001.
3. Dalal, W., and Miao, S., "The Value of Tester Accuracy," Proc. International Test Conference, pp. 518-523, 1999.
4. "HyperTransport™ Technology I/O Link: A High Bandwidth I/O Architecture," Advanced Micro Devices, Inc., 2001.
5. Infiniband™ Architecture Specification, Vols. 1 and 2, Infiniband™ Trade Association, 2001.
6. The International Technology Roadmap for Semiconductors, Test and Test Equipment, 2001.
7. Jaenicke, R., "RapidIO raises PCI stature in the box," EETIMES, April 2001.
8. Keezer, D. C., Zhou, Q., Bair, C., Kuan, J., and Poole, B., "Terabit-per-second Automated Digital Testing," Proc. International Test Conference, pp. 1143-1151, 2001.
9. Maxwell, P., Hartanto, I., and Bentz, L., "Comparing functional and structural tests," Proc. International Test Conference, pp. 400-407, 2000.
10. Oshima, A., Poniatowski, J., and Nomura, T., "Pin Electronics IC for High Speed Differential Devices," Proc. International Test Conference, pp 1128-1133, 2001.
11. Technical Specifications, ITS9000ZX Test System, Schlumberger Semiconductor Solutions, 2002.
12. Technical Specifications, J973-400 VLSI Test System, Teradyne, Inc., 2000.