Attenuated total reflection spectrometer with terahertz free electron laser as a source

IRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics

Volumn , Issue , 2006, Pages 459-

  Cherkassky, V S ^a   Gavrilov, N G ^a   Gerasimov, V V ^a   Knyazev, B A ^a   Rudych, P D ^a   Vinokurov, N A ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ELECTROMAGNETIC WAVES; FREE ELECTRON LASERS; LASERS; MILLIMETER WAVE DEVICES; MILLIMETER WAVES;

INTERNATIONAL CONFERENCES; TERAHERTZ ELECTRONICS;

SPECTROMETRY;

EID: 51449109897     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIMW.2006.368667     Document Type: Conference Paper

References (2)

1. N. J. Harrick,. Internal reflection spectroscopy. Harrick Scientific Corporation, Ossining, NY, 1967.
2. A Volkov, A. S. Prokhorov, Millimeter-submillimeter BWO-spectroscopy of solids, Institute of General Physics, Russian Academy of Sciences, Moscow. www.submm.gpi.ru/English/pic/submm1.pdf