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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 7 B, 2004, Pages 4671-4675

Silicon tip cantilevers for force microscopy in water with resonance of 20 kHz or above

(3) Toda, Akitoshi a Kitazawa, Masashi a Yagi, Akira a

a OLYMPUS CORPORATION (Japan)

Author keywords

AFM; Autofluorescence; Biomolecule; Cantilever; Force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CANTILEVER BEAMS; CHEMICAL VAPOR DEPOSITION; FLUORESCENCE; NATURAL FREQUENCIES; SEMICONDUCTING SILICON; ULTRAVIOLET RADIATION;

AUTOFLUORESCENCE; BIOMOLECULES; FORCE MICROSCOPY;

RESONANCE;

EID: 5144220783 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/JJAP.43.4671 Document Type: Conference Paper

Times cited : (5)

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