A comparison of CuO and Cu2 O hole-injection layers for low voltage organic devices

Applied Physics Letters

Volumn 93, Issue 8, 2008, Pages

  Murdoch, G B ^a   Greiner, M ^a   Helander, M G ^a   Wang, Z B ^a   Lu, Z H ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMINES; COPPER OXIDES; EMISSION SPECTROSCOPY; HOLE TRAPS; LIGHT EMITTING DIODES; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; ORGANIC LIGHT EMITTING DIODES (OLED); PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; TIN; TITANIUM COMPOUNDS;

DRIVING VOLTAGES; HOLE-INJECTION BARRIERS; ORGANIC DEVICES; ORGANIC LIGHT-EMITTING DIODES;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 51349164320     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2966140     Document Type: Article

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