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Volumn , Issue , 2008, Pages 2026-2031

Performance analysis of Power Quality monitoring instruments

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; ELECTRIC CURRENTS; ELECTRIC MEASURING INSTRUMENTS; ELECTRIC POWER SYSTEMS; ELECTRONIC EQUIPMENT TESTING; INSTRUMENTS; MEASUREMENT THEORY; TESTING;

EID: 51349152411     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2008.4547381     Document Type: Conference Paper
Times cited : (16)

References (14)
  • 1
    • 51349108722 scopus 로고    scopus 로고
    • CEI EN 61000-2-5, Electromagnetic compatibility, Classification of electro-magnetic environments, 1995.
    • CEI EN 61000-2-5, Electromagnetic compatibility, Classification of electro-magnetic environments, 1995.
  • 2
    • 51349088575 scopus 로고    scopus 로고
    • CEI EN 1000-3-6, Electromagnetic compatibility, assessment of emission limits for distorting loads in MV and HV power systems.
    • CEI EN 1000-3-6, Electromagnetic compatibility, assessment of emission limits for distorting loads in MV and HV power systems.
  • 3
    • 51349120053 scopus 로고    scopus 로고
    • IEEE Recommended Practices for Monitoring Electric Power Quality, IEEE Standard 1159-1995.
    • IEEE Recommended Practices for Monitoring Electric Power Quality, IEEE Standard 1159-1995.
  • 5
    • 51349169441 scopus 로고    scopus 로고
    • CEI EN 61000-4-4, Electromagnetic compatibility, Electrical fast transient/burst immunity tests, 1995.
    • CEI EN 61000-4-4, Electromagnetic compatibility, Electrical fast transient/burst immunity tests, 1995.
  • 6
    • 51349094679 scopus 로고    scopus 로고
    • CEI EN standard draft 61000-4-7: General guide on harmonics and interharmonics measurements, for power supply systems and equipment connected thereto, Ed. 2000.
    • CEI EN standard draft 61000-4-7: General guide on harmonics and interharmonics measurements, for power supply systems and equipment connected thereto, Ed. 2000.
  • 7
    • 0003948417 scopus 로고
    • Voltage characteristics of electricity sup¬plied by public distribution systems
    • EN 50160, CENELEC November
    • EN 50160, Voltage characteristics of electricity sup¬plied by public distribution systems, CENELEC November 1994.
    • (1994)
  • 8
    • 51349134508 scopus 로고    scopus 로고
    • CEI EN 61000-4-30: Testing and measurement techniques - Power quality measurement methods, Ed. 2003.
    • CEI EN 61000-4-30: Testing and measurement techniques - Power quality measurement methods, Ed. 2003.
  • 9
    • 35348832117 scopus 로고    scopus 로고
    • Flickermeter, functional and design
    • IEC 61000-4-15, specifications
    • IEC 61000-4-15 - Flickermeter, functional and design specifications.
  • 10
    • 0036703737 scopus 로고    scopus 로고
    • A Test System for Calibrating Flickermeters
    • Pages, Aug
    • R. Areseneau, M. E. Sutherland, J.J. Zelle, "A Test System for Calibrating Flickermeters", IEEE Trans. on I&M, vol. 51, issue 4, Page(s): 598-600, Aug. 2002.
    • (2002) IEEE Trans. on I&M , vol.51 , Issue.4 , pp. 598-600
    • Areseneau, R.1    Sutherland, M.E.2    Zelle, J.J.3
  • 11
    • 34748869381 scopus 로고    scopus 로고
    • A New Methodological Approach to Quality Assurance of Energy Meters Under Non-Sinusoidal Conditions
    • Sorrento, Italy, 24-27 April
    • D.Gallo, C.Landi, N.Pasquino, N. Polese "A New Methodological Approach to Quality Assurance of Energy Meters Under Non-Sinusoidal Conditions", Instr. Measur. Techn. Conf. (IMTC/06), Sorrento, Italy, 24-27 April 2006;
    • (2006) Instr. Measur. Techn. Conf. (IMTC/06)
    • Gallo, D.1    Landi, C.2    Pasquino, N.3    Polese, N.4
  • 13
    • 4043055724 scopus 로고    scopus 로고
    • Implementation of a Test System for Advanced Calibration and Performance Analyses of Flickermeters
    • Aug
    • D.Gallo, C.Landi, R.Langella, A.Testa, "Implementation of a Test System for Advanced Calibration and Performance Analyses of Flickermeters", IEEE Transactions on Instrumentation and Measurement, Vol. 53, Issue: 4, Aug. 2004, Pages 1078-1085.
    • (2004) IEEE Transactions on Instrumentation and Measurement , vol.53 , Issue.4 , pp. 1078-1085
    • Gallo, D.1    Landi, C.2    Langella, R.3    Testa, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.