Fault diagnosis with bayesian networks: Application to the tennessee eastman process

Proceedings of the IEEE International Conference on Industrial Technology

Volumn , Issue , 2006, Pages 98-103

  Verron, Sylvain ^a   Tiplica, Teodor ^a   Kobi, Abdessamad ^a  

^a ISTIA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BENCHMARKING; CLASSIFICATION (OF INFORMATION); COMPUTER NETWORKS; DISTRIBUTED PARAMETER NETWORKS; ELECTRIC FAULT CURRENTS; ERROR ANALYSIS; FEATURE EXTRACTION; INFERENCE ENGINES; INTELLIGENT NETWORKS; SPEECH ANALYSIS;

INDUSTRIAL TECHNOLOGIES; INTERNATIONAL CONFERENCES; TENNESSEE EASTMAN PROCESSES;

BAYESIAN NETWORKS;

EID: 51349140351     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIT.2006.372301     Document Type: Conference Paper

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