High-bias breakdown of Au/1,4-benzenedithiol/Au junctions

Applied Physics Letters

Volumn 93, Issue 8, 2008, Pages

  Teramae, Yumi ^a   Horiguchi, Kazunori ^a   Hashimoto, Shuhei ^a   Tsutsui, Makusu ^a   Kurokawa, Shu ^a   Sakai, Akira ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN;

BREAK DOWN VOLTAGES; BROAD DISTRIBUTIONS; VOLTAGE RAMP;

ELECTRIC CONDUCTIVITY;

EID: 51349139161     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2976666     Document Type: Article

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