Study of the evolution of 180° domain pattern micro structure using measurements of nonlinear permittivity

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2007, Pages 336-339

  Mokrý, Pavel ^a   Wang, Yongli ^b   Tagantsev, Alexander K ^b   Stolichnov, Igor ^b  

^a TECHNICAL UNIVERSITY OF LIBEREC   (Czech Republic)

^b EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; CONCENTRATION (PROCESS); FERROELECTRIC FILMS; FERROELECTRIC MATERIALS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; PIEZOELECTRIC TRANSDUCERS; TECHNICAL PRESENTATIONS; THICK FILMS; THIN FILMS;

DOMAIN PATTERNING; INTERNATIONAL SYMPOSIUM;

DOMAIN WALLS;

EID: 51349131560     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAF.2007.4393258     Document Type: Conference Paper

References (13)

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