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Volumn , Issue , 2007, Pages 146-148

Crystalline structure and surface morphology of the AlN films sputtered on 64°-YX LiNbO3

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM COMPOUNDS;

EID: 51349121197     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAF.2007.4393196     Document Type: Conference Paper
Times cited : (1)

References (11)
  • 3
    • 0016557305 scopus 로고
    • Growth morphology and surface-acoustic-wave measurements of AIN films on sapphire
    • J. K. Liu, K. M. Lakin, and K. L. Wang, "Growth morphology and surface-acoustic-wave measurements of AIN films on sapphire," J. Appl. Phy., 1975, vol. 46, pp. 3703-3706.
    • (1975) J. Appl. Phy , vol.46 , pp. 3703-3706
    • Liu, J.K.1    Lakin, K.M.2    Wang, K.L.3
  • 4
    • 51349133686 scopus 로고    scopus 로고
    • 3and AIN/Si, Proc. IEEE Ultrasonics Symp., 1981, pp. 375-380.
    • 3and AIN/Si," Proc. IEEE Ultrasonics Symp., 1981, pp. 375-380.
  • 6
    • 0022115013 scopus 로고
    • Zero-Temperature-Coefficient SAW Devices on AIN Epitaxial Films
    • K. Tsubouchi and N. Mikoshiba, "Zero-Temperature-Coefficient SAW Devices on AIN Epitaxial Films", IEEE Trans. Sonic & Ultranson. 1985, vol. 32, pp. 634-644.
    • (1985) IEEE Trans. Sonic & Ultranson , vol.32 , pp. 634-644
    • Tsubouchi, K.1    Mikoshiba, N.2
  • 7
    • 36749117565 scopus 로고
    • rf-sputtered aluminum nitride films on sapphire
    • A.J. Shuskus, T. M. Reeder, and E.L. Paradis, Appl. Phys. Lett., "rf-sputtered aluminum nitride films on sapphire," 1974, vol. 24, pp. 155-156.
    • (1974) Appl. Phys. Lett , vol.24 , pp. 155-156
    • Shuskus, A.J.1    Reeder, T.M.2    Paradis, E.L.3
  • 8
    • 33744700929 scopus 로고
    • Low-temperature growth of piezoelectric AlN film by rf reactive planar magnetron sputtering
    • T. Shiosaki, T. Yamamoto. T. Oda, and A. Kawabata, "Low-temperature growth of piezoelectric AlN film by rf reactive planar magnetron sputtering," Appl. Phys. Lett., 1980, vol.36, pp. 643-645.
    • (1980) Appl. Phys. Lett , vol.36 , pp. 643-645
    • Shiosaki, T.1    Yamamoto, T.2    Oda, T.3    Kawabata, A.4
  • 9
    • 0019298269 scopus 로고
    • Low Temperature Growth of Piezoelectric AlN Film for Surface and Bulk Wave Transducers by RF Reactive Planar Magnetron Sputtering
    • T. Shiosaki, T. Yamamoto. T. Oda, and A. Harada, "Low Temperature Growth of Piezoelectric AlN Film for Surface and Bulk Wave Transducers by RF Reactive Planar Magnetron Sputtering," Proc. IEEE Ultrasonics Symp., 1980, pp. 451-454.
    • (1980) Proc. IEEE Ultrasonics Symp , pp. 451-454
    • Shiosaki, T.1    Yamamoto, T.2    Oda, T.3    Harada, A.4
  • 11
    • 0030364265 scopus 로고    scopus 로고
    • Measurement techniques for evaluating piezoelectric thin films
    • F. S. Hickernell, "Measurement techniques for evaluating piezoelectric thin films", IEEE Ultrasonics Symp., 1996, vol. 1, pp. 235-242.
    • (1996) IEEE Ultrasonics Symp , vol.1 , pp. 235-242
    • Hickernell, F.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.