Decay mechanisms of lumen and chromaticity for high-power phosphor-based white-light-emitting diodes in thermal aging

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2008, Pages 779-782

  Hsu, Yi Cheng ^c   Tsai, Chun Chin ^a   Chen, Ming Hung ^a   Lo, Yuan Tsun ^a   Lee, Chao Wei ^b   Cheng, Wood Hi ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^c NATIONAL PINGTUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Aging test; Phosphor; White light LEDs

Indexed keywords

ARSENIC COMPOUNDS; COMPUTER NETWORKS; CONCENTRATION (PROCESS); ELECTROMAGNETIC WAVES; EMISSION SPECTROSCOPY; LIGHT EMITTING DIODES; LUMINESCENCE; OPTICAL PROPERTIES; PHOSPHORS; POWER SPECTRUM; REFRACTIVE INDEX; SILICONES; THERMAL AGING;

AGING TEST; HIGH POWERS; PHOSPHOR; WHITE-LIGHT LEDS;

LIGHT EMISSION;

EID: 51349111453     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4550062     Document Type: Conference Paper

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