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Volumn 165, Issue 1-3, 2008, Pages 1-4
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XPS studies of the intermediate valence state of Yb in (YbS)1.25CrS2
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Author keywords
Charge transfer; Misfit layer compounds; Valence fluctuation; X ray photoelectron spectra
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Indexed keywords
CHARGE TRANSFER;
INTERMEDIATE VALENCE;
MISFIT LAYER COMPOUNDS;
VALENCE FLUCTUATION;
X-RAY PHOTOELECTRON SPECTRA;
SEMICONDUCTOR SWITCHES;
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EID: 51349111170
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2008.05.009 Document Type: Article |
Times cited : (93)
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References (27)
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