메뉴 건너뛰기




Volumn , Issue , 2006, Pages 590-593

Experience with the photoinjector laser at FLASH

Author keywords

[No Author keywords available]

Indexed keywords

ACCELERATING STRUCTURE; ELECTRON BUNCH; LASER SYSTEMS; OPERATIONAL ISSUES; PROTECTION SYSTEMS; RELIABLE OPERATION; REPETITION RATE; SOFT X-RAY FEL;

EID: 51349102988     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (12)
  • 2
    • 84884640904 scopus 로고    scopus 로고
    • First lasing at 32-nm of the VUV-FEL at DESY
    • eConf C0508213, MOOB002 (2005), Presented at Stanford, California, 22-26 August
    • S. Schreiber, "First lasing at 32-nm of the VUV-FEL at DESY," eConf C0508213, MOOB002 (2005), Presented at the 27th International Free Electron Laser Conference (FEL 2005), Stanford, California, 22-26 August 2005.
    • (2005) The 27th International Free Electron Laser Conference (FEL 2005)
    • Schreiber, S.1
  • 5
    • 84885377773 scopus 로고    scopus 로고
    • SASE FEL at the TESLA facility, phase 2
    • "SASE FEL at the TESLA Facility, Phase 2," DESY-TESLA-FEL-2002- 01.
    • DESY-TESLA-FEL-2002-01
  • 12
    • 84884611814 scopus 로고    scopus 로고
    • First experience with the machine protections system of FLASH
    • these proceedings
    • L. Fröhlich et al., "First Experience with the Machine Protections System of FLASH,", FEL-2006-THPPH016, these proceedings.
    • FEL-2006-THPPH016
    • Fröhlich, L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.