Electron-backscattered diffraction (EBSD) as a domain analysis technique in BiFeO3-PbTiO3

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2007, Pages 395-397

  Burnett, T L ^a   Comyn, T P ^a   Merson, E ^a   Bell, A J ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

DOMAIN ANALYSIS; INTERNATIONAL SYMPOSIUM;

SEMICONDUCTING BISMUTH COMPOUNDS;

EID: 51349098543     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISAF.2007.4393276     Document Type: Conference Paper

References (12)

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