Low-noise instrumentation for the measurement of piezoresistive AFM cantilever deflection in robotic nanobiocharacterization applications

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn , Issue , 2008, Pages 1392-1396

  Otero, Jorge ^a   Puig Vidal, Manel ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

Author keywords

AFM; I f noise; Nanobiosensor; Robotics; Self sensing cantilevers

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER NETWORKS; INSTRUMENTS; MACHINE DESIGN; MEASUREMENT THEORY; MICROSCOPES; MICROSCOPIC EXAMINATION; MOLECULAR BIOLOGY; NANOROBOTICS; NANOSENSORS; PHOTODIODES; PIEZOELECTRIC ACTUATORS;

AFM; I/F NOISE; NANOBIOSENSOR; ROBOTICS; SELF-SENSING CANTILEVERS;

ROBOTS;

EID: 51349090629     PISSN: 10915281     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2008.4547260     Document Type: Conference Paper

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