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Volumn 18, Issue 2, 1989, Pages 327-337

Void-free Au-Sn eutectic bonding of GaAs dice and its characterization using scanning acoustic microscopy

Author keywords

acoustic mircoscope; bonding; Die attachment; eutectic

Indexed keywords


EID: 51249172449     PISSN: 03615235     EISSN: 1543186X     Source Type: Journal    
DOI: 10.1007/BF02657425     Document Type: Article
Times cited : (61)

References (27)
  • 6
    • 84936575336 scopus 로고    scopus 로고
    • H. F. Cray, “Surface segregation of non-bonding impurities in gold-silicon preforms,“ Proc. 15th International Reliability Physics Symp., 272 (1977).
  • 7
    • 84936575337 scopus 로고    scopus 로고
    • D. R. Kitchen, “Physics of die attach interfaces,“ Proc. 18th International Reliability Physics Symp., 312 (1980).
  • 8
    • 84936575344 scopus 로고    scopus 로고
    • C. E. Hoge and S. Thomas, “Some considerations of the gold-silicon die bond based on surface chemical analysis,“ Proc. 18th International Reliability Physics Symp., 301 (1980).
  • 9
    • 84936575347 scopus 로고    scopus 로고
    • J. Partridge, A. Marques and R. Camp, “Electromigration, thermal analysis and die attach—a case history,“ Proc. 20th International Reliability Physics Symp., 34 (1982).
  • 10
    • 84936575340 scopus 로고    scopus 로고
    • T. P. L. Li, E. L. Zigler, and D. E. Hillyer, “AES/ESCA/ SEM/EDX studies of die bond materials and interfaces,“ Proc. 22nd International Reliability Symp., 169 (1984).
  • 11
    • 84936575342 scopus 로고    scopus 로고
    • R. E. Pyle and H. A. Stevens, “Characterization of die attach failure modes in leadless chip carrier packages by Auger Electron Spectroscopy,“ Proc. 22nd International Reliability Physics Symp., 175 (1984).
  • 12
    • 84936575330 scopus 로고    scopus 로고
    • N. P. Mencinger, M. P. Carthy, and R. C. McDonald, “Use of wetting angle measurements in reliability evaluations of Au-Si eutectic die attach,“ Proc. 23rd International Reliability Physics Symp., 173 (1985).
  • 13
    • 84936575318 scopus 로고    scopus 로고
    • R. L. Opila and J. D. Sinclair, “Electrical reliability of silver filled epoxies for die attach,“ Proc. 23rd International Reliability Physics Symp., 164 (1985).
  • 15
    • 84936575319 scopus 로고    scopus 로고
    • S. K. Wang, C. C. Lee, and C. S. Tsai, “Nondestructive visualization and characterization of material joints using a scanning acoustic microscope,“ Proc. 1977 IEEE Ultrasonics Symp., 171 (1977).
  • 16
    • 84936575320 scopus 로고    scopus 로고
    • C. C. Lee, Integrated Optics for RF Spectrum Analysis and Acoustic Microscopy for the Study of Material Joints, Ph.D. Thesis, Carnegie Mellon University (1979).
  • 26
    • 84936575321 scopus 로고    scopus 로고
    • Indium Corporation of America, Utica, NY.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.