SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Journal of Electronic Materials

Volumn 17, Issue 5, 1988, Pages 467-471

Activation energies associated with current noise of thin metal films

(2) Cottle, J G a Chen, T M a

a UNIVERSITY OF SOUTH FLORIDA (United States)

Author keywords

activation energy; current noise; Thin metal films

Indexed keywords

EID: 51249172240 PISSN: 03615235 EISSN: 1543186X Source Type: Journal
DOI: 10.1007/BF02652134 Document Type: Article

Times cited : (17)

References (17)

1
- 0000162640
- (1981) Solid State Electron. , vol.24 , pp. 583
- Schreiber, H.U.¹

2
- 0000590312
- (1959) Phys. Rev. , vol.113 , pp. 1462
- Spokas, J.¹ Slichter, C.²

3
- 0016473653
- (1975) Thin Solid Films , vol.25 , pp. 327
- Blech, I.A.¹ Kinsbron, E.²

4
- 0022162760
- (1985) Solid State Electron. , vol.28 , pp. 1153
- Schreiber, H.U.¹

5
- 0014630193
- (1969) Proc. IEEE , vol.57 , pp. 1587
- Black, J.R.¹

6
- 0002626228
- Electromigration in Thin Films
- J., Poate, K. N., Tu, J., Mayer, J. Wiley & Sons, N.Y.
- (1975) Thin Films; Interdiffusion and Reactions , pp. 266
- d’Heurle, F.M.¹ Ho, P.S.²

7
- 84936636558
- B. J. Root and T. Turner, Proc. of 23rd Intl. Rel. Phys. Symp., pp. 100-107, (1985).

8
- 84936636555
- C. C. Hong and D. L. Crook, Proc. of 23rd Intl. Rel. Phys. Symp., pp. 108-114, (1985).

9
- 0020750359
- Temperature-ramp resistance analysis to characterize electromigration
- (1983) Solid-State Electronics , vol.26 , pp. 445
- Pasco, R.W.¹ Schwarz, J.A.²

10
- 84936676936
- (1984) Solid State Technol. , vol.27 , pp. 287
- Towner, J.M.¹

11
- 0042994988
- (1973) Appl. Phys. Lett. , vol.23 , pp. 287
- Vossen, J.L.¹

12
- 84936636520
- T. M. Chen, T. P. Djeu and R. D. Moore, Proc. of 23rd International Reliab. Phys. Symp., pp. 87-92, (1985).

13
- 0001756436
- (1985) Phys. Rev. Lett. , vol.55 , pp. 2487
- Koch, R.H.¹ Lloyd, J.R.² Cronin, J.³

14
- 0008649375
- (1981) Rev. Mod. Phys. , vol.53 , pp. 497
- Dutta, P.¹ Horn, P.M.²

15
- 84936636521
- J. G. Cottle, Excess Noise and Its Relationship to Electromigration in Thin Film Interconnections, Ph.D. Dissertation, University of South Florida, pg. 71, (1987).

16
- 84936636524
- T. M. Chen, J. G. Cottle and L. M. Head, Proc. 9th Intl. Conf. on Noise in Phys. Systems, Montreal (1987).

17
- 84936636525
- J. G. Cottle, T. M. Chen and K. P. Rodbell, Proc. of 26th International Reliab. Phys. Symp. (1988).

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.