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La Rivista Del Nuovo Cimento Series 3

Volumn 17, Issue 11, 1994, Pages 1-63

Radiation damage in silicon detectors

(2) Borchi, E a Bruzzi, M a

a Dipartimento di Energetica (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 51249170539 PISSN: 0393697X EISSN: 18269850 Source Type: Journal
DOI: 10.1007/BF02724516 Document Type: Article

Times cited : (22)

References (123)

2
- 84935510969
- T. Angelescu, I. Golutvin and S. Lazanu: Silicon detectors for high energy physics, Institute of Atomic Physics, Bucharest, internal report, HE-121-1992.

3
- 44949271545
- (1991) Nucl. Instrum. Methods A , vol.310 , pp. 497
- Hylen, J.¹ Matthews, J.² Weinstein, A.³ Hubbard, B.⁴ O'Shaughnessy, K.⁵ Piztl, D.⁶ Seiden, A.⁷ Miller, W.⁸ Thompson, T.⁹ Gamble, M.¹⁰ Baker, C.¹¹ Dransfield, G.¹² Ziock, H.¹³ Ried, R.¹⁴ Woloshun, K.¹⁵ Bradley, J.¹⁶

4
- 0024701783
- (1989) Nucl. Instrum. Methods A , vol.279 , pp. 223
- Sadrozinski, H.F.¹ Seiden, A.² Weinstein, A.J.³

5
- 0012024396
- Wiley, New York, N.Y.
- (1966) Semiconductor Counters for Nuclear Radiation
- Dearnaley, G.¹ Northrop, C.²

6
- 0344372487
- (1991) Nature , vol.349 , pp. 379
- Miller, D.J.¹

7
- 0003824089
- Wiley, New York, N.Y.
- (1984) Quarks and Leptons, an Introductory Course in Modern Particle Physics
- Halzen, F.¹ Martin, A.D.²

8
- 36849151193
- (1989) Nature , vol.340 , pp. 277
- Ellis, J.¹

9
- 44949270685
- (1991) Nucl. Instrum. Methods A , vol.310 , pp. 35
- Miller, D.J.¹

10
- 0004005306
- Wiley, Singapore
- (1981) Physics of Semiconductor Devices
- Sze, S.M.¹

11
- 0010813068
- (1982) Riv. Nuovo Cimento , vol.5 , pp. 7
- Rancoita, P.G.¹ Seidman, A.²

12
- 0022755632
- (1987) Nucl. Instrum. Methods A , vol.257 , pp. 587
- Holl, P.¹ Dietl, H.² Fent, J.³ Lutz, G.⁴ Sedlmeir, J.⁵ Settles, R.⁶ Struder, L.⁷ Buttler, W.⁸ Hosticka, B.J.⁹ Zimmer, G.¹⁰ Bagliesi, G.¹¹ Batignani, G.¹² Focardi, E.¹³ Forti, F.¹⁴ Giorgi, M.A.¹⁵ Scapellato, S.¹⁶ Tonelli, G.¹⁷ Triggiani, G.¹⁸

13
- 43949168907
- OPAL Collaboration
- (1993) Nucl. Phys. B , vol.32 , pp. 208
- Allport, P.P.¹

14
- 23544449037
- Status of the L3 silicon microvertex detector
- (1993) Nuclear Physics B - Proceedings Supplements , vol.32 , pp. 202
- Adriani, O.¹

15
- 4243424072
- (1993) Nucl. Phys. B , vol.32 , pp. 37
- Stevenson, G.R.¹

16
- 84935504186
- D. Groom: internal report on Superconducting supercollider, SSC-SR-1033 (1988).

17
- 0342270974
- Neutron energy deposition mechanisms in silicon calorimetry
- R., Donaldson, M. G. D., Gilchriese, World Scientific, Singapore
- (1990) Proceedings of the Workshop on Calorimetry for the Supercollider, 13–17 March, 1989, Tuscaloosa, Ala.
- Russ, J.S.¹

18
- 0027557855
- (1993) Nucl. Instrum. Methods A , vol.326 , pp. 357
- Fretwurst, E.¹ Claussen, N.² Croitoru, N.³ Lindstrom, G.⁴ Papendick, B.⁵ Pein, U.⁶ Schatz, H.⁷ Wunstorf, R.⁸

19
- 0001208566
- (1991) Nucl. Instrum. Methods A , vol.310 , pp. 283
- Edwards, M.¹ Hall, G.² Sotthibandhu, S.³

20
- 84935517404
- T. Angelescu, V. Ghete, I. Lazanu, A. Mihul, I. Girlea, C. Girlea, M. Labau, S. Lazanu and A. Vasilescu: A neutron irradiation facility for damage studies, University of Bucharest internal report, UBPub.-EPPG/Phys. 5, 1993.

21
- 0003934325
- Wiley, New York, N.Y.
- (1989) Radiation Detection and Measurement
- Knoll, G.F.¹

22
- 84935435907
- F. Lemeilleur, M. Glaser, E. H. M. Heijne, P. Jarron, C. Soave, C. Leroy, J. Rioux, P. Roy, M. Siad and I. Trigger: CERN internal report ECP 93-21.

23
- 0024702529
- (1989) Nucl. Instrum. Methods A , vol.279 , pp. 266
- Kraner, H.W.¹ Li, Z.² Posnecker, K.U.³

24
- 84935421547
- V. L. Vinetskii and G. A. Kholodar: Quasichemical reactions involving point defects in semiconductors, in Physics of Radiation Effects in Crystals, Vol. 13, edited by V. M. Agranovich and A. A. Maradudin (North-Holland, 1986), pp. 283–344.

25
- 0007294644
- (1951) Z. Phys. Chem. (Leipzig) , vol.198 , pp. 107
- James, H.M.¹ Lark-Horovitz, K.²

26
- 36149013384
- Production of Divacancies and Vacancies by Electron Irradiation of Silicon
- (1965) Physical Review , vol.138 , pp. 555
- Corbett, J.W.¹ Watkins, G.D.²

27
- 0000437604
- (1975) Phys. Rev. B , vol.13 , pp. 2653
- Lee¹ Corbett, J.W.²

28
- 36149019492
- Defects in Irradiated Silicon: Electron Paramagnetic Resonance of the Divacancy
- (1965) Physical Review , vol.138 , pp. 543
- Watkins, G.D.¹ Corbett, J.W.²

29
- 0040608853
- (1966) Phys. Rev. , vol.152 , pp. 152
- Cheng, L.J.¹ Corelli, J.C.² Corbett, J.W.³ Watkins, G.D.⁴

30
- 36149016389
- Defects in Irradiated Silicon: Electron Paramagnetic Resonance and Electron-Nuclear Double Resonance of the Si-ECenter
- (1964) Physical Review , vol.134 , pp. 1359
- Watkins, G.D.¹ Corbett, J.W.²

31
- 0000955336
- (1959) J. Appl. Phys. , vol.30 , pp. 1214
- Gossick, B.R.¹

32
- 0002057819
- Neutron Produced Trapping Centers in Junction Field Effect Transistors
- (1971) IEEE Transactions on Nuclear Science , vol.18 , pp. 50
- Gregory, B.L.¹ Naik, S.S.² Oldham, W.G.³

33
- 0003495751
- John Wiley and Sons, New York, N.Y.
- (1989) Ionizing Radiation Effects in MOS Devices and Circuits
- Ma, T.P.¹

34
- 84935434276
- T. Schulman: HU-SEFT-1991-07, 1991.

35
- 0019633415
- (1981) J. Appl. Phys. , vol.52 , pp. 6704
- Borsuk, J.A.¹ Swanson, R.M.²

36
- 0012605672
- (1990) J. Appl. Phys. , vol.68 , pp. 1059
- Goguenheim, D.¹ Lannoo, M.²

37
- 0021425445
- (1984) J. Appl. Phys. , vol.55 , pp. 3644
- Pons, D.¹

38
- 84870580329
- Cambridge University Press, Cambridge
- (1986) Numerical Recipes
- Press, W.H.¹ Flannery, B.P.² Teukolsky, S.A.³ Vetterling, W.T.⁴

39
- 0003879668
- Wiley, New York, N.Y.
- (1967) Physics and Technology of Semiconductor Devices
- Grove, A.S.¹

40
- 0003958752
- C. L., Chien, C. R., Westgate, Plenum, New York, N.Y.
- (1980) The Hall Effect and its Applications
- Beer, A.C.¹

41
- 0016081559
- (1974) J. Appl. Phys. , vol.45 , pp. 3023
- Lang, D.V.¹

42
- 0038787775
- (1968) J. Appl. Phys. , vol.39 , pp. 5149
- Weisberg, L.R.¹ Schade, J.²

43
- 0014597915
- (1969) Solid-State Electron. , vol.12 , pp. 857
- Schade, H.¹ Herrick, D.²

44
- 49649143165
- (1972) Solid-State Electron. , vol.15 , pp. 69
- Bueheler, M.G.¹

45
- 0042688670
- (1972) Appl. Phys. Lett. , vol.20 , pp. 193
- Sah, C.T.¹ Chan, W.W.² Fu, H.S.³ Walker, J.W.⁴

46
- 84935515695
- (1965) Phys. Rev. , vol.130 , pp. 543
- Stein, J.¹

47
- 4244205977
- (1972) Phys. Rev. B , vol.5 , pp. 1505
- Chen, C.S.¹ Corelli, J.C.²

48
- 0000671494
- (1968) Phys. Rev. , vol.173 , pp. 734
- Kalma, A.H.¹ Corelli, J.C.²

49
- 36149009491
- (1961) Phys. Rev. , vol.121 , pp. 1001
- Watkins, G.D.¹ Corbett, J.W.²

50
- 4243808774
- (1991) Nucl. Instrum. Methods A , vol.308 , pp. 585
- Li, Z.¹ Chen, W.² Kraner, H.W.³

51
- 0042660317
- (1971) Solid-State Electron. , vol.14 , pp. 182
- Forbes, L.¹ Sah, C.T.²

52
- 0040469010
- (1993) Rev. Sci. Instrum , vol.64 , pp. 932
- Baldini, A.¹ Bruzzi, M.²

53
- 0020737019
- (1983) J. Appl. Phys. , vol.54 , pp. 1924
- Micocci, G.¹ Rizzo, A.² Tepore, A.³

54
- 84935518675
- M. Bruzzi: TSC-DATA analysis of heavily irradiated silicon detectors, to be published in Nucl. Instrum. Methods A.

55
- 0012825757
- Springer-Verlag, Berlin
- (1985) Semiconductor Physics, Springer Ser. Solid-State Sci.
- Seeger, K.¹

56
- 0016116273
- Relationship between resistivity and phosphorus concentration in silicon
- (1974) Journal of Applied Physics , vol.45 , pp. 4576
- Moustly, F.¹ Ostoja, P.² Passari, L.³

57
- 55949133390
- (1968) J. Phys. Soc. Jpn. , vol.25 , pp. 1622
- Sasaki, W.¹ Kinoshita, J.²

58
- 84935511446
- presented at the I International Conference on Large Scale Application and Radiation Hardness of Semiconductor Detectors, Firenze, July 1993, Proc. SIF, 46, Editrice Compositori, Bologna
- (1994) Type inversion measurements on irradiated silicon by means of Hall effect , pp. 115
- Biggeri, U.¹ Borchi, E.² Bruzzi, M.³ Lazanu, S.⁴ Li, Z.⁵ Beuttenmuller, R.⁶

59
- 84882885629
- Resistivity Measurements on Germanium for Transistors
- (1954) Proceedings of the IRE , vol.42 , pp. 420
- Valdes, L.B.¹

60
- 0004214002
- (1958) Philips Res. Rept. , vol.13 , pp. 1
- Van der Pauw, L.J.¹

61
- 84935511549
- P. M. Hemmeger: Rev. Sci. Instrum., 44, No. 6, 1973.

62
- 84935512103
- G. Hall: Imperial College, London, (GB), internal report, IC/HEP/90/8 and Proceedings of the Large Hadron Collider Workshop, Aachen, October 1990, unpublished.

63
- 0026868260
- (1992) Nucl. Instrum. Methods A , vol.315 , pp. 149
- Wunstorf, R.¹ Benkert, M.² Claussen, N.³ Fretwurst, E.⁴ Lindstroem, G.⁵ Schulz, T.⁶

64
- 84935430588
- C. Leroy, M. Glaser, E. H. M. Heijne, P. Jarron, F. Lemeilleur, J. Rioux, C. Soave and I. Trigger: CERN internal reports, CERN/ECP 93-12 and ECP 93-8, 1993.

65
- 84935520790
- RD-2 Collaboration (S. Bateset al.): Recent results of radiation damage studies in silicon, to be published in the Proceedings of the V Topical Seminar on Experimental Apparatus for Particle Physics and Astrophysics, San Miniato, Italy, April 1993.

66
- 0026136867
- (1991) IEEE Trans. Nucl. Sci. , vol.38 , pp. 269
- Ziock, H.¹

67
- 84935522344
- M. Edwardset al.: Nucl. Instrum. Methods A, 326, (1993).

68
- 0742310727
- (1988) J. Appl. Phys. , vol.64 , pp. 6349
- Cerofolini, G.F.¹ Polignano, M.L.²

69
- 0022024898
- Modeling the generation current due to donor-acceptor twins in silicon p-n junctions
- (1985) IEEE Transactions on Electron Devices , vol.32 , pp. 628
- Cerofolini, G.F.¹ Polignano, M.L.² Savoini, E.³ Vanzi, M.⁴

70
- 0026868985
- (1992) Nucl. Instrum. Methods A , vol.315 , pp. 182
- Baldini, A.¹ Borchi, E.² Bruzzi, M.³ Spillantini, P.⁴

72
- 0026868044
- Study of the effects of neutron irradiation on silicon strip detectors
- (1992) Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , vol.315 , pp. 156
- Giubellino, P.¹ Panizza, G.² Hall, G.³ Sotthibandu, S.⁴ Ziock, H.J.⁵ Ferguson, P.⁶ Sommer, W.F.⁷ Edwards, M.⁸ Cartiglia, N.⁹ Hubbard, B.¹⁰ Leslie, J.¹¹ Pitzl, D.¹² O'Shaughnessy, K.¹³ Rowe, W.¹⁴ Sadrozinski, H.F.-W.¹⁵ Seiden, A.¹⁶ Spencer, E.¹⁷

73
- 44949274001
- (1991) Nucl. Instrum. Methods A , vol.310 , pp. 192
- Roe, S.¹

74
- 0005568616
- (1991) Nucl. Instrum. Methods A , vol.310 , pp. 273
- Borchi, E.¹ Bruzzi, M.² Mazzoni, M.S.³

75
- 4243808774
- (1991) Nucl. Instrum. Methods A , vol.308 , pp. 585
- Li, Z.¹ Chen, W.² Kraner, H.W.³

76
- 24244463739
- (1993) Nucl. Phys. B , vol.32 , pp. 415
- Lemeilleur, F.¹ Glaser, M.² Heijne, E.H.M.³ Jaron, P.⁴ Occelli, E.⁵ Rioux, J.⁶

77
- 84935435495
- F. Lemeilleur: CERN internal report CERN/ECP 91-16, 1991.

78
- 84935517017
- D. Pitzlet al.: Nucl. Instrum. Methods A, 311, (1992).

79
- 84935513064
- Z. Li, W. Chen and H. W. Kraner: Proceedings of the Symposium R&D for SSC, Forthworth, Texas, 1990 (World Scientific, 1991), pp. 148–153.

80
- 0024622667
- Effects of deep imperfection levels on the capacitance of semiconductor detectors
- (1989) Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment , vol.276 , pp. 270
- Dabrowski, W.¹ Korbel, K.²

81
- 0003798925
- Wiley, New York, N.Y.
- (1973) Deep Impurities in Semiconductors
- Milnes, A.G.¹

82
- 0040978130
- (1993) Nucl. Phys. B , vol.32 , pp. 398
- Li, Z.¹ Kraner, H.W.²

83
- 44949271185
- (1991) Nucl. Instrum. Methods A , vol.310 , pp. 277
- Chilingarov, A.¹ Dolbnya, I.² Kurylo, S.³

84
- 84935429169
- G. Lindstroemet al.: Internal report, DESY 89-105 1989.

85
- 84935432684
- H. F. W. Sadrozinski, N. Cartiglia, J. Dewitt, D. E. Dorfan, B. Hubbard, K. O'Shaughnessy, D. Pitzl, W. A. Rowe, A. Seiden, E. Spencer, P. Ferguson, C. M. Hoffman, W. W. Kinnison, E. C. Milnwer, W. F. Sommer, H. J. Ziock, P. Giubellino and J. Ellison: Radiation-Hard front end electronics and silicon microstrip detectors, internal report of the University of Santa Cruz, Cal., USA, 1990.

86
- 0018434105
- (1979) Jpn. J. Appl. Phys. , vol.18 , pp. 309
- Tokuda, Y.¹ Shimizu, N.² Usami, A.³

87
- 0019572507
- Conparison of Neutron and 2 MeV Electron Damage in N-Type Silicon by Deep-Level Transient Spectroscopy
- (1981) IEEE Transactions on Nuclear Science , vol.28 , pp. 3564
- Tokuda, Y.¹ Usami, A.²

88
- 84990706320
- Radiation defects in fast neutron-, electron-, and γ-irradiated silicon
- (1987) Physica Status Solidi (a) , vol.100 , pp. K13
- Tulach, L.¹ Frank, H.² Sopko, B.³ Prasil, Z.⁴

89
- 0019560218
- (1981) J. Appl. Phys. , vol.52 , pp. 3337
- Jaworowski, A.E.¹

90
- 0022246423
- (1985) Phys. Status Solidi A , vol.92 , pp. 609
- Londos, C.A.¹

91
- 0000004567
- Proton irradiation of silicon: Complete electrical characterization of the induced recombination centers
- (1990) Journal of Applied Physics , vol.68 , pp. 2702
- Huppi, M.W.¹

92
- 36549100008
- (1990) J. Appl. Phys. , vol.67 , pp. 1266
- Hallén, A.¹ Sundqvist, B.U.R.² Paska, Z.³ Svensson, B.G.⁴ Rosling, M.⁵ Tirén, J.⁶

93
- 0007708876
- (1993) J. Appl. Phys. , vol.73 , pp. 3698
- Asghar, M.¹ Zafar Iqbal, M.² Zafar, N.³

94
- 0024699040
- (1989) Nucl. Instrum. Methods A , vol.279 , pp. 277
- Borchi, E.¹ Bertrand, C.² Leroy, C.³ Bruzzi, M.⁴ Furetta, C.⁵ Paludetto, R.⁶ Rancoita, P.G.⁷ Vismara, L.⁸ Giubellino, P.⁹

95
- 84935489967
- M. Bruzzi: Dissertation, Scuola di Scienze e Tecnologia dei Materiali, 1990 (unpublished).

96
- 0026117299
- (1991) Phys. Status Solidi A , vol.124 , pp. K27
- Borchi, E.¹ Bruzzi, M.² Mazzoni, M.S.³

97
- 0017147853
- (1976) Radiat. Effects , vol.29 , pp. 25
- Heijne, H.M.¹ Muller, J.C.² Siffert, P.³

98
- 0020171578
- (1982) J. Appl. Phys. , vol.53 , pp. 5715
- Jellison, G.E.¹

99
- 84935523083
- (1988) J. Appl. Phys. , vol.64 , pp. 11
- Awadelkarim, O.O.¹ Monemar, B.²

100
- 0027559842
- (1993) Nucl. Instrum. Methods A , vol.326 , pp. 344
- Bruzzi, M.¹ Baldini, A.² Borchi, E.³ Lukianov, I.⁴

101
- 0040342545
- (1992) J. Appl. Phys. , vol.72 , pp. 4007
- Bruzzi, M.¹ Borchi, E.² Baldini, A.³

102
- 0028493986
- (1994) IEEE Trans. Nucl. Sci. , vol.41 , pp. 964
- Biggeri, U.¹ Borchi, E.² Bruzzi, M.³ Li, Z.⁴ Lazanu, S.⁵

103
- 84935499204
- presented at the I International Conference on Large Scale Application and Radiation Hardness of Semiconductor Detectors, Firenze, July 1993, Proc. SIF, 46, Editrice Compositori, Bologna
- (1994) Influence of oxidation on radiation hardness of silicon detectors , pp. 123
- Kraner, H.W.¹ Li, Z.² Lazanu, S.³ Biggeri, U.⁴ Borchi, E.⁵ Bruzzi, M.⁶

104
- 0026904011
- (1992) IEEE Trans. Nucl. Sci. , vol.39 , pp. 577
- Li, Z.¹ Kraner, H.W.²

105
- 0001717526
- (1991) Nucl. Phys. B Proc. Suppl. , vol.23 A , pp. 324
- Wunstorf, R.¹

106
- 84935520591
- (1957) Phys. Rev. , vol.105 , pp. 6
- Wertheim, G.K.¹

107
- 36049059107
- (1967) Phys. Rev. , vol.163 , pp. 801
- Stein, H.J.¹

108
- 84935474253
- (1959) J. Appl. Phys. , vol.30 , pp. 8
- Crawford, J.H.¹ Cleland, J.W.²

109
- 0001517388
- Hall Effect and Conductivity in Porous Media
- (1956) Journal of Applied Physics , vol.27 , pp. 838
- Juretschle¹ Landauer² Swanson³

110
- 0011336826
- Radiation Defects Created by Co60 γ-Rays in p- and n-Type Si of High Purity
- (1969) physica status solidi (b) , vol.35 , pp. 1043
- Konozenko, I.D.¹ Semenyuk, A.K.² Khivrich, V.I.³

111
- 84935472077
- F. Lemeilleur, M. Glaser, E. H. M. Heijne, P. Jarron, C. Soave, C. Leroy, J. Rioux, P. Roy, M. Siad and I. Trigger: CERN Internal report ECP 93-8, presented at the International Conference on Calorimetry in High-Energy Physics, La Biodola, Isola d'Elba, Italy, 19–25 September 1993.

112
- 84935452309
- E. Fretwurstet al.: to be published in the Proceedings of the International Symposium on Development and Applications of Semiconductor Tracking Detectors, Hiroshima, Japan, May 1993.

113
- 0343576252
- R., Donaldson, M. G. D., Gilchriese, World Scientific, Singapore
- (1990) Proceedings of the Workshop on Calorimetry for the Supercollider, Tuscaloosa, Ala., 13–17 March, 1989 , pp. 489
- Bertrand, C.¹ Borchi, E.² Brau, J.E.³ Bruzzi, M.⁴ Bugg, W.M.⁵ Furuno, K.⁶ Lamarche, F.⁷ Leroy, C.⁸ Lindstroem, G.⁹ Mazzoni, S.¹⁰ Oghsugi, T.¹¹ Rancoita, P.G.¹² Russ, J.¹³ Vismara, L.¹⁴

114
- 84913906136
- R., Donaldson, M. G. D., Gilchriese, World Scientific, Singapore
- (1990) Proceedings of the Workshop on Calorimetry for the Supercollider, Tuscaloosa, Ala., 13–17 March, 1989 , pp. 659
- Lindstrom, G.¹ Fretwurst, E.² Herdan, H.³ Rollwagen, M.⁴ Thoen, P.⁵ Wunstorf, R.⁶

115
- 36449009261
- (1993) J. Appl. Phys. , vol.73 , pp. 3740
- Dannefaer, S.¹ Mascher, P.² Kerr, D.³

116
- 84990717246
- Potential of Fast Neutron Damage Regions in Heavily Doped Semiconductors
- (1989) physica status solidi (b) , vol.154 , pp. 507
- Litvinov, V.L.¹ Ukhlin, N.A.² Churakov³

117
- 84935424775
- H. J. Ziocket al.: talk presented at the International Symposium on Development and Application of Semiconductor Tracking Detectors, Hiroshima, Japan, May 1993.

118
- 84935445657
- G. Lutz: A simplistic model for reverse annealing in irradiated silicon, internal report Max Planck Institut fur Physik, March 1994.

119
- 0028400372
- (1994) Nucl. Instrum. Methods A , vol.342 , pp. 119
- Fretwurst, E.¹

120
- 84935425196
- H. Feick: presented at the VI Pisa Meeting, Frontier Detectors for Frontier Physics, Isola d'Elba, Italy, May 1994, to be published in Nucl. Instrum. Methods.

121
- 84935460254
- F. Lemeilleuret al.: presented at the VI Pisa Meeting, Frontier Detectors for Frontier Physics, Isola d'Elba, Italy, May 1994, to be published on Nucl. Instrum. Methods.

122
- 84935505103
- U. Biggeri, E. Borchi, M. Bruzzi and S. Lazanu: Deep levels profile in neutron irradiated silicon detectors, presented at VI Pisa Meeting Frontier Detectors for Frontier Physics, Isola d'Elba, Italy, May 1994, to be published on Nucl. Instrum. Methods.

123
- 0003705471
- Von Nostrand Reinhold Company, New York, N.Y.
- (1986) The Effect of Irradiation in Electronic Systems
- Messenger, G.C.¹ Ash, M.S.²

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