메뉴 건너뛰기
Journal of Electronic Materials
Volumn 24, Issue 4, 1995, Pages 303-309
Characterization and optimization of the SiO2/SiC metal-oxide semiconductor interface
Author keywords

ac conductance technique; metal oxide semiconductor interface; SiO2 SiC
Indexed keywords

EID: 51249162328     PISSN: 03615235     EISSN: 1543186X     Source Type: Journal    
DOI: 10.1007/BF02659691     Document Type: Article
Times cited : (153)
References (27)
  • 2
    • 84936495459 scopus 로고    scopus 로고
    • D.M. Brown, M. Ghezzo, J. Kretchmer, V. Krishnamurthy, G. Michon and G. Gati, presented at the 2nd Intl. High Temp. Electro. Conf. (1994).
  • 3
    • 84936495458 scopus 로고    scopus 로고
    • W. Xie, J.A. Cooper, Jr. and M.R. Melloch to be published in IEEE Electron. Dev. Lett.
  • 5
    • 84936495461 scopus 로고    scopus 로고
    • J.W. Palmour, H.S. Kong, D.G. Waltz, J.A. Edmond and C.H. Carter, Jr., Proc. of the 1st Intl. High Temp. Electron. Conf. (1991), p. 511.
  • 8
    • 84936495460 scopus 로고    scopus 로고
    • N. Singh and A. Rys, J. Appl. Phys.lZ, 1279 (1993).
  • 15
    • 84936495454 scopus 로고    scopus 로고
    • J.N. Shenoy, L.A. Lipkin, G.L. Chindalore, J. Pan, J.A. Cooper, Jr., J.W. Palmour and M.R. Melloch, to be published in Proc. 21st Intl. Symp. on Compound Semiconductors, San Diego, CA(1994).
  • 16
    • 84936495455 scopus 로고    scopus 로고
    • S.T. Sheppard, J.A. Cooper, Jr. and M.R. Melloch, J. Appl. Phys. 3205 (1994).
  • 23
    • 84936495456 scopus 로고    scopus 로고
    • J.W. Sanders, M.S. Thesis, Purdue University (1993).

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.