Effect of GeO2 additive on fluorescence intensity enhancement in bismuth-doped silica glass

Pacific Rim Conference on Lasers and Electro-Optics, CLEO - Technical Digest

Volumn , Issue , 2007, Pages

  Fujimoto, Yasushi ^a   Hirata, Yuki ^b   Kuwada, Yoshiyuki ^a   Nakatsuka, Masahiro ^a  

^a OSAKA UNIVERSITY   (Japan)

^b KINKI UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRO-OPTICS; ENHANCEMENT OF FLUORESCENCE; PACIFIC RIM;

PLASTICS MOLDING MACHINES;

EID: 51249094768     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CLEOPR.2007.4391339     Document Type: Conference Paper

References (7)

1. Y. Fujimoto and M. Nakatsuka, Jpn. J. Appl. Phys., 40 (2001) L279.
2. Y. Fujimoto, and M. Nakatsuka, Appl. Phys. Lett., 82 (2003) 3325.
3. S. Parke and R. S. Webb, J. Phys. Chem. Solids, 34 (1973) 85.
4. A. C. van der Steen, J. J. A. van Hesteren, and A. P. Slok, J. Electrochem. Soc, 128 (1981) 1327.
5. M. J. Weber and R. R. Monchamp, J. Appl. Phys., 44 (1973) 5495.
6. Y. Fujimoto and M. Nakatsuka, J. Non-Cryst. Solids, 352, 2254 (2006).
7. "Structural analysis of Bi doped silica glasses by XAFS", Takashi Okura, Yasushi Fujimoto, and Masahiro Nakatsuka, IQEC/CLEO-PR2005, QTuD4-2, 11-15 July 2005, Toshi Center Hotel, Tokyo, JAPAN.