Generation of hole traps in thin silicon oxide layers under high-field electron injection

Applied Physics Letters

Volumn , Issue , 1995, Pages 1826-

  Brozek, Tomasz ^a   Viswanathan, Chand R ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

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EID: 51149217853     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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