Interface roughness scattering in GaAs/AlAs quantum wells

Applied Physics Letters

Volumn 51, Issue 23, 1987, Pages 1934-1936

  Sakaki, H ^a   Noda, T ^a   Hirakawa, K ^a   Tanaka, M ^a   Matsusue, T ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 51149213981     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.98305     Document Type: Article

References (10)