Current probe method applied in conductive electromagnetic compatibility (EMC)

2008 International Conference on Microwave and Millimeter Wave Technology Proceedings, ICMMT

Volumn 3, Issue , 2008, Pages 1442-1445

  Zhao, Y ^a   See, K Y ^b   Li, S J ^a   Jiang, N Q ^a   Wang, Q ^a   Cao, Y ^a   Wu, X H ^a  

^a NANJING NORMAL UNIVERSITY   (China)

^b NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Current probe measurement; EMC, EMI filter design; Noise diagnosis network

Indexed keywords

COMPUTER NETWORKS; ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC PULSE; MICROWAVES; MILLIMETER WAVE DEVICES; MILLIMETER WAVES; PLASTIC MOLDS;

CURRENT PROBE MEASUREMENT; CURRENT PROBES; EMC, EMI FILTER DESIGN; NOISE DIAGNOSIS NETWORK;

ELECTROMAGNETIC WAVES;

EID: 51149097379     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICMMT.2008.4540716     Document Type: Conference Paper

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