A new vectorial signature for quick symbol indexing, filtering and recognition

Proceedings of the International Conference on Document Analysis and Recognition, ICDAR

Volumn 1, Issue , 2007, Pages 536-540

  Zhang, Wan ^a   Wenyin, Liu ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

DATA SETS; DOCUMENT ANALYSIS; INTERNATIONAL CONFERENCES;

CODES (SYMBOLS);

EID: 51149086380     PISSN: 15205363     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICDAR.2007.4378767     Document Type: Conference Paper

References (8)

1. C. Ah-Soon and K. Tombre. Architectural symbol recognition using a network of constraints. Pattern Recognition Letters, 22(2):231-248, 2001.
2. P. Dosch and J. Lladós. Vectorial signatures for symbol discrimination. In Proceeding of GREC 2003, pages 154-165, 2003.
3. Y. Liu, L. Wenyin, and C. Jiang. A structural approach to recognizing incomplete graphic objects. In Proceedings of the 17th International Conference on Pattern Recognitions, Cambridge (UK), 2004.
4. J. Lladós, E. Martin, and J. J. Villanuev. Symbol recognition by error-tolerant subgraph matching between region adjacency graphs. IEEE Trans. Pattern Anal. Mach. Intell., 23(10):1137-1143, 2001.
5. K. Tombre, C. Ah-Soon, P. Dosch, G. Masini, and S. Tabbone. Stable and robust vectorization: How to make the right choices. In A. Chhabra and D. Dori, editors, Graphics Recognition-Recent Advances, volume 1941 of Lecture Notes in Computer Science, pages 3-18, 2000.
6. E. Valveny and P. Dosch. Symbol recognition contest: A synthesis. In J. Llados and Y. Kwon, editors, LNCS-Graphics Recognition:Recent Advances and Perspectives, volume 3088, pages 367-385. Springer-Verlag, 2004.
7. S. Yang. Symbol recognition via statistical integration of pixel-level constraint histograms: a new descriptor. IEEE Trans. Pattern Anal. Mach. Intell., 27:278-281, 2005.
8. W. Zhang, L. Wenyin, and K. Zhang. Symbol recognition with kernel density matching. IEEE Transactions on Pattern Analysis and Machine Intelligence, 28(12):2020-2024, 2006.