Deconvolution of 3D fluorescence micrographs with automatic risk minimization

2008 5th IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Proceedings, ISBI

Volumn , Issue , 2008, Pages 732-735

  Ramani, Sathish ^a   Vonesch, Cédric ^a   Unser, Michael ^a  

^a EPFL   (Switzerland)

Author keywords

3D fluorescence microscopy; CCD noise; Deconvolution; Unbiased risk estimate (URE)

Indexed keywords

CHARGE COUPLED DEVICES; CONVOLUTION; DECONVOLUTION; ERROR ANALYSIS; FLUORESCENCE; FLUORESCENCE MICROSCOPY; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; OPTIMIZATION; PARAMETER ESTIMATION; RISK PERCEPTION; TECHNICAL PRESENTATIONS; THREE DIMENSIONAL;

3D FLUORESCENCE MICROSCOPY; CCD NOISE; REGULARIZATION PARAMETERS; RISK MEASURE; UNBIASED RISK ESTIMATE (URE);

MATHEMATICAL MODELS;

EID: 51049124037     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISBI.2008.4541100     Document Type: Conference Paper

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