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Volumn , Issue , 2008, Pages 1371-1374
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Automated lateral sectioning for knife-edge scanning microscopy
a
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Author keywords
KESM; Knife edge scanning microscopy; Microscopy; Serial sectioning
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Indexed keywords
DEFORMATION;
SCANNING;
INTERNATIONAL SYMPOSIUM;
KESM;
KNIFE-EDGE SCANNING MICROSCOPY;
MICROSCOPY;
SERIAL SECTIONING;
TISSUE;
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EID: 51049117252
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/ISBI.2008.4541260 Document Type: Conference Paper |
Times cited : (7)
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References (6)
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