메뉴 건너뛰기




Volumn 79, Issue 7, 2008, Pages 21-24

X-rays beat the counterfeiters

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; INDOMETACIN;

EID: 51049115154     PISSN: 02624230     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (2)

References (1)
  • 1
    • 51049118054 scopus 로고    scopus 로고
    • Automated XRD investigation of pharmaceutical products; Non-invasive screening of blister-packaged tablets by X-ray diffraction, 2008, Application note
    • Automated XRD investigation of pharmaceutical products; Non-invasive screening of blister-packaged tablets by X-ray diffraction. (2008), Application note: www.panalytcal.com


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.