Piezoelectric properties of SiXGe1-XO2 crystals

Proceedings of the IEEE International Frequency Control Symposium and Exposition

Volumn , Issue , 2007, Pages 704-710

  Balitsky, Vladimir ^a   Detaint, Jacques ^b   Armand, Pascale ^c   Papet, Philippe ^c   Balitsky, Denis ^c  

^a INSTITUTE OF EXPERIMENTAL MINERALOGY   (Russian Federation)

^b UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^c UNIVERSITÉ DE MONTPELLIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC CHARACTERISTICS; EUROPEAN; FREQUENCY CONTROLS;

SILICON;

EID: 51049108774     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/FREQ.2007.4319166     Document Type: Conference Paper

References (6)

1. 2", Kristallografiya, vol. 45/1, 2000, p. 151-153.
2. 2 solid solution single crystals with quartz structure", J. Cryst. Growth, vol. 275, 2005, p. 807-811.
3. 4)", J. Cryst. Growth, vol. 166, 1996, p. 347-353.
4. R. Bechmann, A. D. Ballato, T. J. Lukaszek, "Higher order temperature coefficient of the elastic stiffness and compliance of alpha-quartz", proceedings of the IRE vol 30 Aug. 1962 p. 1812-1822.
5. A. Glowinski, Ann. Telecom. 27, 1972, 147.
6. B. J. James, "A new measurement of the basic elastic and dielectric constants of quartz," Frequency Control Symposium, 1988., Proceedings of the 42nd Annual, 1-3 Jun. 1988 pp. 146-154.