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Volumn 70, Issue 4, 2008, Pages 18-19

A solution to the "No Defect Found" problem

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOTIVE ELECTRONICS; COMMERCIAL ELECTRONICS; CONTINUOUS MONITORING; SOLDER JOINTS; TEMPERATURE CYCLING;

EID: 51049103361     PISSN: 01934120     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (1)
  • 1
    • 51049100948 scopus 로고    scopus 로고
    • Hobbs, Gregg K., HALT and HASS, the Proven Reliability Paradigm, Hobbs Engineering Corp., Westminster, CO. 2003.
    • Hobbs, Gregg K., HALT and HASS, the Proven Reliability Paradigm, Hobbs Engineering Corp., Westminster, CO. 2003.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.