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Volumn 99, Issue 8, 2008, Pages 907-911
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Measurement of the isothermal sections at 700 and 427°C in the Al-Mg-Ni system
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Author keywords
Al Mg Ni ternary system; Electron probe microanalysis; Phase diagram; Scanning electron microscopy; X ray diffraction
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Indexed keywords
COMPUTER NETWORKS;
ELECTRON PROBE MICROANALYSIS;
MICROANALYSIS;
MICROSCOPIC EXAMINATION;
NICKEL ALLOYS;
AL-MG-NI TERNARY SYSTEM;
EXPERIMENTAL INVESTIGATIONS;
PHASE DIAGRAM;
SCANNING ELECTRON MICROSCOPY;
X-RAY DIFFRACTION;
ALUMINUM;
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EID: 50949130965
PISSN: 18625282
EISSN: None
Source Type: Journal
DOI: 10.3139/146.101719 Document Type: Article |
Times cited : (13)
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References (13)
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