Implantable cardioverter-defibrillator lead disintegration at the level of the tricuspid valve

Heart Rhythm

Volumn 5, Issue 8, 2008, Pages 1224-1225

  Duray, Gabor Z ^a   Israel, Carsten W ^a   Schmitt, Jörn ^a   Hohnloser, Stefan H ^a  

^a Section Clinical Electrophysiology   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CASE REPORT; DEFIBRILLATOR; DEVICE REMOVAL; ELECTRIC SHOCK; ELECTROCARDIOGRAPHY; FLUOROSCOPY; HEART VENTRICLE FIBRILLATION; HUMAN; MECHANICAL STRESS; PRIORITY JOURNAL; SCAR FORMATION; TRICUSPID VALVE;

DEFIBRILLATORS, IMPLANTABLE; ELECTRODES; EQUIPMENT FAILURE; HUMANS; LEAD; TRICUSPID VALVE;

EID: 50949122705     PISSN: 15475271     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.hrthm.2008.03.008     Document Type: Article

References (1)

1. Kleemann T., Becker T., Doenges K., et al. Annual rate of transvenous defibrillation lead defects in implantable cardioverter-defibrillators over a period of >10 years. Circulation 115 (2007) 2474-2480